Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM) - Debbie Stokes
The first title in the NEW RMS Handbook Series this book offers a simple starting point to VP-ESEM, especially for new users, technicians and students.
~ Contains clear, concise explanations
~ Principles & applications outlined are generic and applicable to all types of VP-ESEM
~ Enables the reader to turn principles into practice
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Aberration-corrected Analytical Electron Microscopy - Editor Rik Brydson
This new title in the Series is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
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As a special way of saying Happy Holidays, our publishing partner, Wiley-Blackwell, is extending to you a 40% discount on virtually all John Wiley & Sons print books*. The discount is good through December 31, 2011, and can be accessed at: www.wiley.com/promo/HH1
*Excludes all German language books and some major reference works
(Normally RMS Members are entitled to a 25% discount on RMS / Wiley Handbooks - contact us for details.)
