This page was created by Cubik's Content Migrator for MCMS.
For your reference, this page was migrated from:
http: // www.rms.org.uk / event_fib.shtml
Delete this message as part of your post-migration clean-up process.
Location:
Department of Zoology, University of Oxford
Date:
15/04/2005 - 15/04/2005
Contact:
Victoria Lee
Tel:
01865 248768
Fax:
01865 791237
Email:
victoria@rms.org.uk
Event Description
Focused ion beam (FIB) microscopy is a unique interactive tool for the in-situ, site-specific nanomachining and microstructural analysis of nanostructures. There is dramatic growth in FIB activity in areas such as direct device processing, 3D micromachining for MEMS, nanopatterning, biological and nanomaterials analysis.
This one-day meeting is aimed at both current and future FIB users, covering the latest exciting FIB developments in the areas of nanoprocessing and nanoanalysis techniques, and state-of-the-art FIB instrumental development. Important topics will be highlighted in keynote presentations,
Abstracts for short oral and poster contributions (200 words in length) were invited in the FIB technology areas of:
Semiconductor devices and failure analysis
Novel 3D micromachining applications and tool manufacture
Nanopatterning
Biological applications of FIB
Specimen preparation methods for nanoanalysis
Instrumentation development
Abstract submission closed 18th March 2005
NanoFIB 2005 follows on from Microscopy of Semiconducting
Materials MSM XIV 11-14 April 2005
NanoFIB network bursaries will be available for attendance at this meeting
Event Programme
Oral Programme:
10.00 Registration, Tea and Coffee
10.25 Welcome: Dr Beverley J Inkson
Session One Chair: Prof Mark Blamire
10.30 (Invited) Prof P E Russell - North Carolina State University
Focused ion beam sample preparation of complex devices
11.00 Dr S Orso - MPI fr Metallforschung, Stuttgart
A novel insitu method for mechanical testing of biological samples at the micrometer scale
11.20 Dr P A Warburton - University College London
Three-dimensional ion and electron beam fabrication using a cross-beam microscope
11.40 Dr W Li - University of Salford
Rectifying nano-homo contacts of W-Ga-C composite pad and nanowires fabricated by focused ion beam assisted chemical vapour deposition
12.00 (Invited) Prof P Prewett/Dr J Teng - University of Birmingham
FIB fabrication of MEMS components
12.30 Lunch and Poster Session
Session Two
13.30 (Invited) Dr J Gierak - CNRS
Exploration of the ultimate patterning potential achievable with focused ion beams
14.00 (Invited) R Forbes - University of Surrey
14.30 Dr R Jain - Credence System Co.
Nano-patterning using a coaxial photon-ion column
14.50 Dr F Prez-Willard - University of Karlsruhe
FIB patterning of magnetic metamaterials at telecommunication frequencies
15.10 (Invited) Dr L Bischoff - Forschungszentrum Rossendorf
The application of FIB from mass separated alloy LMIS
15.40 Tea and Coffee / Poster Session
Session Three Chair: Dr Beverley J Inkson
16.10 (Invited) Prof M Milani - University of Milano-Bicocca
FIB applications and perspectives in life sciences
16.40 Dr P Gnauck - Carl Zeiss Ltd.
High resolution investigation of the interface between biological cell tissue and hard substrate materials using crossbeam technology
17.00 Dr T Kamino - Hitachi Science systems
Application of a dedicated FIB system to 3D structural characterisation of biological cells
17.20 Close of Meeting
Event Poster Details
1. Paul Cook - University of Salford
Exposure dose affected electrical properties of TiO2 nanotube
2. Frances Docherty - University of Glasgow
Sample preparation for nanoanalytical electron microscopy using the FIB liftout method and low energy ion milling
3. Francisco Hernndez - Universitat de Barcelona
Nanocontacts fabricated by Focused Ion Beam (FIB): characterisation and application to nanometre-sized materials
4. Emanuela Ricci - STMicroelectronics, Italy
FIB preparation of TEM samples: sacrificial lamella approach
5. Damjana Drobne - University of Ljubljana
Lipid secretion in the digestive glands investigated by the FIB / SEM system
6. Yizhong Huang - University of Oxford
Bioerosion of titanium by RAW264.7 macrophagic cells in vitro
7. Giles Graham - Lawrence Livermore National Laboratory, USA
Small Particle Manipulation By Focused Ion Beam Microscopy: Spores to Stardust
8. Paul F.A. Alkemade - Delft University of Technology
Milling Foils
9. Zhaorong Huang - Cranfield University
Combining Ar ion milling with FIB lift-out techniques to prepare high quality site- specific TEM samples
10. Wei Zhou - Nanyang Technological University
Approaches to Surface Nanopatterning by Focused Ion Beam
Scientific organisers:
Dr. Mark Blamire (NanoFIB) & Dr. Beverley Inkson (NanoFIB):
THERE IS AN ONLINE REGISTRATION DEADLINE OF WEDNESDAY 6TH APRIL
