Scientific Organiser: Ali Gholinia, University of Manchester
A two day meeting presenting both state-of-the-art and emerging Electron Back Scatter Diffraction techniques, highlighting the application of EBSD and related techniques in industry for quality and product development and discussing its application to geoscience.
The annual EBSD meeting offers an opportunity for users and developers of EBSD and related techniques to meet and discuss their work, with a two day series of technical talks and a lively poster session. The meeting has been running for over twenty years and we regularly welcome top academics from the UK, European and global research community. This meeting will include talks that focus not only on technique development but also include applications to real engineering problems and scientific questions, as well as approaches to combine data obtained using EBSD with other techniques. EBSD is widely used to develop further understanding in the fields of engineering, materials science and earth sciences.
With our meeting being hosted in Manchester this year, we hope you'll take the opportunity to join us and spark a lively debate on current approaches and future developments in this exciting and evolving research field. There will be a two day exhibition alongside this Meeting.
Events and Outreach Manager
Exhibition and Sponsorship Contact
Exhibitions Manager & Corporate Member Liaison
currently on maternity leave
- 08:30Registration and Coffee
- 09:00Session One - Chair: Ali Gholina
Welcome and Introduction - Ali Gholina
- 09:103D Mapping of polycrystals by diffraction contrast tomography in the laboratory - Philip Withers
- 09:40Correlation between 5-parameter grain boundary character and corrosion resistance of a 304 stainless steel by 3D-EBSD - Peter Konijnenberg
- 10:00Selective alpha phase precipitation at beta grain boundaries in Ti-17 alloys - Tao Liu
- 10:202-D EBSD of a shot peened Al-7075-T651 Alloy: Plasma Xe+ FIB versus Ga+ FIB - Bart Winiarksi
- 10:40Tea/Coffee and Exhibition
- 11:10Session Two - Chair: Philip Withers
Automated three dimensional broad ion beam milling acquisition and analysis - Ali Gholina
- 11:30Microstructure and ionic conductivity of SOFCs studied by 3D EBSD and complex impedance spectroscopy - Marek Faryna
- 11:50Cryo-EBSD provides new insight on weakening mechanisms during deformation of polycrystalline ice - Matthew Vaughan
- 12:10Distinguishing shocked and tectonic microstructures in quartz - Martyn Drury
- 12:30Investigating Volcanic, Magmatic & Shock Histories within Meteorites using Electron Backscatter Diffraction - Natasha Stephen
- 12:50TECHNOBITE: Just scratching the surface of sample prep: mechanical versus ion polishing - Steve Murray, Hitachi High-Technologies
- 13:00Lunch & Exhibition
- 14:00Session Three - Chair: Ben Britton
Estimation of the beam spread in a specimen to form EBSD pattern - Seiichi Suzuki
- 14:20Overcoming common EBSD errors - Keith Dicks
- 14:40EBSD Analysis of porous materials - René de Kloe
- 15:00TECHNOBITE: Applying EBSD to Industry - Jenny Goulden, Oxford Instruments
- 15:10Tea/Coffee and Exhibition
- 15:40Session Four - Chair: Martyn Drury
The characterisation of nanoscale features in rocks and meteorites using transmission Kikuchi diffraction - Patrick Trimby
- 16:10Advantages of TKD in SEM using on-axis detector - Daniel Goran
- 16:30Nanostructure Characterisation of Flow-formed Cr-Mo-V Steel using Transmission Kikuchi Diffraction Technique - Soran Birosca
- 16:50Exploring Transmission Kikuchi Diffraction using a digital CMOS hybrid pixel detector - Stefano Vespucci
- 17:10TECHNOBITE: Precession Electron Diffraction Applications in TEM: Orientation/Phase Mapping and Strain Analysis at nm scale - Vrettos Stelliou, NanoMEGAS
- 17:20Poster Session with Prizes and Drinks Reception
- 19:30Conference Dinner
- 09:00Session Five - Chair: Patrick Trimby
Analysing Elastic and Plastic Strains using EBSD - a review of advances and pitfalls - Angus Wilkinson
- 09:30Stress fields close to deformation twin tips in hexagonal close-packed polycrystalline materials - Hamidreza Abdolvand
- 09:50Investigation of deformation process in dual-phase Ti alloy using combined in-situ micropillar compression and HR-EBSD - Tea-Sung Jun
- 10:10in-situ HR-EBSD characterization during micro-mechanical testing - Xavier Maeder
- 10:30Tea/Coffee and Exhibition
- 11:00Session Six - Chair: Angus Wilkinson
The power of correlative microscopy-understanding deformation compatibility with HR-EBSD and HR-DIC - Ben Britton
- 11:20Grain growth in Zircalloy-4 - Vivian Tong
- 11:40Revealing fracture mechanism of non-metallic inclusion in Ni-based superalloy using HR-EBSD and HR-DIC - Jun Jiang
- 12:00Electron backscattered diffraction and electron channelling contrast imaging of a cross-section semi-polar (11-22) gaN on patterned r-sapphire substrates - Arantxa Vilalta-Clemente
- 12:20Assessment of optical distortion in EBSD systems from a simple beam shift experiment - Tomohito Tanaka
- 12:40Toy model for Kikuchi pattern formation: What is between "channeling-in" and "channeling-out"? - Aimo Winkelmann
- 13:00Lunch and Exhibition
- 14:00Session Seven - Chair: Carol Trager-Cowan
Electron channelling contrast imaging (ECCI) - Recent advances and new applications - Stefan Zaefferer
- 14:30How advanced EBSD and Accurate-ECCI can be applied to quantify sub-boundaries induced during dislocational creep of uranium dioxide - Mariem Ben Saada
- 14:50Crystal Orientation Mapping using ion image series:iCHORD - Cyril Langlois
- 15:10Accurate Electron Channeling Contrast Imaging as a powerful tool for analyzing low angle sub-grain boundaries - Haithem Mansour
- 15:30Understanding the microstructure evolution of a quenching and partitioning steel using EBSD, EDX and nano-indentation - Zhuangming Li
- 15:50TECHNOBITE: Data averaging tools for improved mapping results - René de Kloe, EDAX
- 16:00Closing Remarks
- 16:35Meeting Close
Registration Deadline: Monday 7 March
On Tuesday 22 March there will be a conference dinner at Bem Brasil, a local restaurant. The dinner is included in the registration fee for the Meeting.
An email will be sent to you three weeks before the event with final details.
Manchester Conference Centre, 78 Sackville St, Manchester, M1 3NJ
The EBSD 2016 Meeting is taking place at the Manchester Conference Centre which has accommodation on site. This can be booked at www.pendulumhotel.co.uk, please quote ‘DELMCC’ to get the best possible rate.
Other hotels in the area include; Hotel ibis on Princess Street, Holiday Inn on Oxford Road, and the Doubletree on Picadilly Place. They are all approx. 5 minutes away from the Manchester Conference Centre.
If travelling by car, we would recommend using the NCP car park located opposite the venue on Charles Street, Manchester M1 3BB. £10 for 24 hour parking.
Dr Patrick Trimby
University of Sydney
‘The characterisation of nanoscale features in rocks and meteorites using transmission Kikuchi diffraction’
Prof Angus Wilkinson
University of Oxford
‘Analysing Elastic and Plastic Strains using EBSD – a review of advances and pitfalls’
Prof Philip Withers
University of Manchester
'3D mapping of polycrystals by diffraction contrast tomography in the laboratory'
Dr Stefan Zaefferer
'Electron channelling contrast imaging (ECCI) – Recent advances and new applications'
Acutance Scientific Ltd provides innovative scientific and metrology instruments to the UK and Ireland market, especially in SEM/TEM and atomic analysis / mapping. We provide a few highly innovative solutions that break new ground.
We represent CAMECA in the UK, with "Rolls-Royce" EPMA, near-atomic resolution Atom Probe Tomography, top-end SIMS, NanoSIMS, and LEXES.
Find out more about BLG Vantage here
For almost 50 years Bruker has been driven by a single goal: to provide the best technological solution for each analytical task. Today, worldwide, more than 4,000 employees in over 90 locations on all continents work towards this enduring vision.
Bruker’s drive to develop state-of-the-art technologies and innovative solutions for today’s analytical questions remains constant, evidenced by the many product lines that lead their respective markets. With one of the world’s most comprehensive ranges of scientific instrumentation available under one brand, the Bruker name is synonymous with excellence, innovation and quality.
EDAX is a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectrometry (EDS), Wavelength Dispersive Spectrometry (WDS), Electron Backscatter Diffraction (EBSD) and Micro X-ray Fluorescence (XRF).
EDAX products include standalone tools for EDS, EBSD and WDS, integrated tools for EDS/EBSD, EDS/WDS, and EDS/EBSD/WDS, and a free-standing micro-XRF bench-top elemental analyzer providing small and micro-spot x-ray analysis and mapping.
EDAX develops the best solutions for micro- and nano-characterization, where elemental and/or structural information is required, making analysis easier and more accurate.
EDAX designs, manufactures, distributes and services products for a broad range of industries, educational institutions and research organisations.
See beyond with FEI's leading edge SEM, TEM, ESEM and DualBeam™ solutions. Our 60 year history of pushing the boundaries of microscope innovation has resulted in instruments delivering sub-nm SEM and sub-Å TEM resolution. Whatever your application in materials or life sciences, FEI delivers the highest performance solution, and puts you at the center of a global community of leading researchers and scientists. See beyond at fei.com
Gatan is the industry leader in the research, development and manufacturing of SEM and TEM products.
For TEM, Gatan provides an unrivalled range of high performance digital imaging and analytical systems, especially EELS spectrometers and energy filters (EFTEM). For SEM, Gatan are world leaders in cathodoluminescence (CL) technology and complement this with cooling stages and EBIC products.
Gatan is striving for continuous product innovations to increase users' productivity and make electron microscopes more effective and powerful tools. Visit the website for complete information on Gatan's extensive range of products for electron microscopy.
At Hitachi High-Technologies our primary goal is to provide customers with powerful, dependable and easy-to-use microscope solutions for the advancement of science & engineering. Our technologically advanced solutions in SEM, TEM and FIB are developed through a long-term commitment to research and development, drawing upon the resources of the whole Hitachi group.
By employing recognised pioneers and developing long term partnerships with world-renowned authorities in electron microscopy, we are able to provide unique technologies which push the boundaries of science. Our Tabletop Microscope is making electron microscope capabilities accessible to all, whilst key technologies such as cold field emission and Cs-correction are making ultra-low voltage imaging in SEM and atomically resolved imaging and analysis in TEM/STEM a practical reality.
Leica Microsystems GmbH
Leica Microsystems develops and manufactures microscopes and scientific instruments for the analysis of microstructures and nanostructures. Ever since the company started as a family business in the nineteenth century, its instruments have been widely recognized for their optical precision and innovative technology. It is one of the market leaders in compound and stereo microscopy, digital microscopy, confocal laser scanning microscopy with related imaging systems, electron microscopy sample preparation, and surgical microscopes.
Leica Microsystems has seven major plants and product development sites around the world. The company is represented in over 100 countries, has sales and service organizations in 20 countries, and an international network of distribution partners. Its headquarters are located in Wetzlar, Germany.
Find out more about NanoMEGAS here
Oxford Instruments (UK) Ltd
1959-2009 Celebrating 50 years of scientific excellence and innovation.
Oxford Instruments celebrates over fifty years which have seen a number of “world’s firsts”, technology breakthroughs and innovative new products.
Innovation has always been at the heart of Oxford Instruments and is the driving force behind its growth and success. There is now a continuous flow of new ideas driven by the demands of the markets and the focus on developing commercially successful products.
Quorum Technologies is a leading manufacturer of preparation instruments for SEM and TEM.
The Polaron and Emitech product ranges include cryo systems for SEM; sputter coaters ranging from the compact entry level SC7620 to a multiple head system for 12 semiconductor wafers; carbon coaters for SEM and TEM and high vacuum evaporators. Quorum also manufactures laboratory critical point dryers, freeze dryers, a SEM Peltier stage and a series of compact recirculating heater chillers. The K1050X bench top RF plasma barrel reactor is suitable for a wider range of plasma etching, ashing and cleaning applications.
EBSD Training Tutorial Workshop
If you have registered for the EBSD Meeting, you can opt to attend the EBSD Training Tutorial Workshop, preceding the meeting on Monday 21 March, in the university buildings near by the Manchester Conference Centre.
The workshop costs £45 to attend and is an introduction to the EBSD two day meeting.
To register, please email Kate Wooding.
09.30 - 10.00 Registration with Tea/Coffee
10.00 - 13.00 Confirmed Invited Speakers:
10.00 - 10.20 Introduction to EBSD – Angus Wilkinson, University of Oxford
10.20 - 10.40 Introduction to ECCI – Stefan Zaefferer, MPIE
10.40 - 11.00 Introduction on Sample Preparation – Michael Hassel-Shearer, Gatan
11.00 - 11.20 Introduction to Phase Identification – Aimo Winkelmann, Bruker Nano
11.20 - 11.40 Introduction to Texture Analysis – Klaus Mehnert, Oxford Instruments EBSD Consultant
11.40 - 12.00 Introduction to Elastic & Plastic Strain Analysis – Ben Britton, Imperial College London
12.00 - 12.20 Introduction to Transmission Kikuchi Diffraction – Patrick Trimby, University of Sydney
12.20 - 12.40 Introduction to Orientation and Phase Mapping in TEM – Muriel Veron, Grenoble INP
12.40 - 13.00 Introduction to Data collection, Band detection, and Clean up – René de Kloe, EDAX
13.00 – 14.00 Sandwich lunch
14.00 – 15.30 Company workshop sessions running in parallel with one another:
This workshop is now full - Sample preparation for EBSD – Gatan live demonstration, Presented by Dr Michael Hassel-Shearer and Dr Mark Day
Orientation and Phase Mapping in TEM – NanoMEGAS offline demonstration part 1, Presented by Dr. Muriel Veron, Grenoble INP
This workshop is now full - High speed mapping at low beam currents - using averaging techniques to improve indexing success - EDAX Live demonstration, Presented by René de Kloe
This workshop is now full - Acquiring simultaneous EBSD & EDS data from bulk samples. Including an overview of set-up parameters, phase identification, methods for differentiating crystallographically similar structures and how this mapping data can be used to determining sample properties, such as grain size and texture – Oxford Instruments live demonstration, Presented by Keith Dicks and Kim Larsen
This workshop is now full - TKD analysis with an on-axis detection system - Bruker live demonstration, Presented by Daniel Goran
15:30 – 15.45 Tea/Coffee
15.45 – 17.15 Company workshop sessions running in parallel with one another:
This workshop is now full - Sample preparation for EBSD – Gatan live demonstration, Presented by Dr Michael Hassel-Shearer and Dr Mark Day
Orientation and Phase Mapping in TEM – NanoMEGAS live demonstration part 2, Presented by Dr. Muriel Veron, Grenoble INP
This workshop is now full - High speed mapping at low beam currents - using averaging techniques to improve indexing success - EDAX live demonstration, Presented by René de Kloe
This workshop is now full - Acquiring simultaneous EBSD & EDS data from thin samples. Including an overview of set-up parameters, phase identification, methods for differentiating crystallographically similar structures and how this mapping data can be used to determining sample properties, such as grain size and texture – Oxford Instruments live demonstration, Presented by Kim Larsen and Pat Trimby
This workshop is now full - Advanced phase identification using combined EBSD, EDS, dynamical simulations and image correlation - Bruker offline demonstration, Presented by Daniel Goran
Company workshop sessions explained:
Some workshop topics consist of one live demonstration repeated before and after the afternoon tea break. Other topics will run one offline presentation followed by a live demonstration after the tea break. We would expect the same delegates to register for the part one offline session and the part two live session, on the same topic. Priority will be given to the delegates wanting to attend both sessions. The company sessions can only accommodate 7 delegates per session. To register please email Kate Wooding and include your session choices. Places will be given on a first come, first served basis, we advise early booking.Download the Monday Workshop programme