The 20th Microscopy of Semi Conducting Materials will take place in Oxford in 2017.
The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy, X-ray topography and diffraction will also be featured.
Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.
Registration is now open
Dr Thomas Walther
University of Sheffield
Thomas is Reader in Advanced Electron Microscopy at the University of Sheffield and Director of the Kroto Centre for High Resolution Imaging and Analysis.
His research areas include electron microscopy method development and instrumentation, in particular HREM, EFTEM, ADF-STEM, EELS, ELNES, EDX.
A focus is on quantitative analysis of semiconductor quantum wells and quantum dots, but also the study of interdiffusion and segregation at grain boundaries and within metal nano-particles.
He runs the Microscopy of Semiconducting Materials conference series which is alternatingly held in Oxford and Cambridge, always in odd years.
Dr Lewys Jones FRMS
University of Oxford
After a first degree in Material Science, I received my PhD from the Department of Materials at the University of Oxford in 2013. This focussed on two themes; scanning stability in the aberration-corrected scanning transmission electron microscope (AC-STEM) and also on applications of focal series of annular dark-field data. In 2014 a software plug-in for Digital Micrograph to correct scan-noise (the Jitterbug software) was launched in collaboration withHREM Research. More recently in 2016, another plug-in to bring fast non-rigid registration to DM was launched (SmartAlign).
I sit on the Editorial Board of the journal Advanced Structural and Chemical Imaging, and have been a Fellow of the Royal Microscopical Society since 2015.
University of Liverpool, UK
Eindhoven University of Technology, the Netherlands
Jaime Gómez Rivas studied Physics and Astrophysics at the Universidad Complutense of Madrid (Spain) and at the Université de Liege (Belgium). In 2002 he received the PhD degree at the University of Amsterdam (The Netherlands) for his research on Anderson localization of light. He worked as postdoctoral researcher at the RWTH University in Aachen (Germany) from 2002 until 2005 on THz photonics and plasmonics. In 2005 Gómez Rivas become project leader at the FOM Institute for Atomic and Molecular Physics, AMOLF, in Amsterdam and at Philips Research in Eindhoven (The Netherlands), setting up the group Surface Photonics working on nano- and THz-photonics. In 2010 he was appointed as part-time professor at Eindhoven University of Technology (TU/e) and group leader at AMOLF. In 2015 Gómez Rivas moved with his group to the Dutch Institute for Fundamental Energy Research in Eindhoven and he became full-professor at TU/e. Gómez Rivas is co-author of over 120 publications in peer-reviewed journals and co-inventor of 20 patents and patent applications.
North Carolina State University, USA
James earned his B.S. in Materials Science & Engineering from Rensselaer Polytechnic Institute in 2006 and his Ph.D. from the University of California Santa Barbara in 2010. After his graduate work, he joined the Department of Materials Science and Engineering at North Carolina State University as a faculty member in 2011 and was promoted to Associate Professor in 2016. His research focuses on applying and developing transmission electron microscopy techniques to determine the atomic structure and chemistry of materials. For his research, James has been honored with numerous awards including the NSF CAREER award and the AFOSR Young Investigator grant. He has been recognized by the Microanalysis Society with a Distinguished Scholar award, the Birks Award, and the K.F.J Heinrich award recognizing a scientist under the age of forty for distinguished technical contributions in the field. Most recently, his work was selected for a 2016 Best Paper award in the journal Microscopy and Microanalysis. Since 2006, he has co-authored over 60 journal articles, which have been cited over 1500 times.
Dr Anna Mogalitenko
Ferdinand Braun Institute, Germany
Anna Mogilatenko has studied Materials Science and obtained an Engineer Degree (Dipl.-Ing.) at National Technical University of the Ukraine in Kiev. Her PhD (Physics Department of Chemnitz University of Technology, Germany) was focused on transmission electron microscopy analysis of thin silicide films. As a postdoc at Humboldt University of Berlin she started analysing group-III nitride materials. Her current research interests at Ferdinand-Braun-Institute include analysis of defect distributions and compositional changes in AlGaN-based heterostructures. This allows for understanding, developing and improving of devices like photodetectors and light emitting and laser diodes operating in the ultraviolet wavelength range. The applied analyses techniques include diffraction contrast analysis, HAADF STEM, CBED, HRTEM, EDXS and EELS as well as CL in SEM.
IMR Tohoku University, Japan
I am working in the Physics of Crystal Defects division in IMR as an associate professor (http://lab-defects.imr.tohoku.ac.jp/ohno/ohno.html). A focus is on quantitative analyses of the impurity segregation ability of grain boundaries in Si and compounds by atom probe tomography (with an impurity detection limit less than 0.005 at.% on a boundary simultaneously with a spatial resolution less than 0.4 nm) combined with HAADF-STEM and ab-initio calculations, but also the study of atomistic structures of semiconductor nanostructures by optical measurements (CL, PL, SNOM) under TEM.
Dr Pierre Ruterana
CIMAP ENSICAEN, France
Dr. Pierre Ruterana is Doctor es Science in Materials Science. His is Director of Research in CNRS (French National Centre for Scientific Research). He is Head of the Research TEAM "Properties of materials for energy savings" PM2E in Laboratory CIPAM (Centre de Recherche sur les Matériaux, les Ions et la Photonique). Dr Ruterana is specialist in high resolution electron microscopy with applications to numerous materials including semiconductors, ceramics, catalysts and nanomaterials. He joined CNRS in 1991, since then he has trained some 20 PhD students, collaborated in many national and international projects, coordinating most of them. He has contributed to more than 300 scientific publications in peer reviewed journals, and delivered more than 70 invited talks at international conferences. Up to now, he has been the principal organiser of more than 10 workshops and/or symposia at international conferences.
Dr Ana Sanchez
University of Warwick, UK
Ana is Principal Research Fellow at the University of Warwick. Her research interests are based on developing the field of advanced transmission electron microscopy techniques and materials characterization, mainly in the areas of semiconductors (including 2D dichalcogenides) and ferroelectric materials. She has been collaborating with world-leading groups using advanced microscopy techniques both to determine defect structure in materials and the challenging and technologically relevant problem of determining strain and composition at nanometer scale.
National Insitute of Materials Science, Japan
Takashi Sekiguchi has been engaged in the study of defects in semiconductors using cathodoluminescence and EBIC for 30 years and published more than 400 papers. His started this work on the dislocation related luminescence in Si. Then, he has been studying wide variety of materials from multicrystalline Si for solar cells, widegap semiconductors like GaN and SiC, III-V quantum structures, and various types of nanoparticles.
Universitat Marburg, Germany
Prof. Qihua Xiong
Nanyang Technological Univeristy Q
ihua Xiong received his B.S. degree in physics from Wuhan University in 1997, and then finished three years graduate studies at the Shanghai Institute of Applied Physics, Chinese Academy of Sciences. He went to the United States in 2000 and received Ph.D. degree under the supervision of Prof. Peter C. Eklund from The Pennsylvania State University in 2006. After three years postdoctoral experience in Prof. Charles M. Lieber’s group at Harvard University, he joined Nanyang Technological University as an assistant professor in 2009 and promoted to Nanyang Associate Professor in 2014. He was promoted to full Professor in 2016 recently. He is a Fellow of Singapore National Research Foundation awarded in 2009 and the inaugural NRF Investigatorship Award by Singapore National Research Foundation. Prof. Xiong’s research focuses on light-matter interactions of emergent quantum matter by optical spectroscopy approaches. He recently ventured into the field of 2D layered materials and laser cooling of solids.
Prof. Hongzhou Zhang
Trinity College Dublin
Prof. Zhang received his PhD in Applied Physics at Rice University (US) in 1999. He worked as a Research Fellow at the Australian National University for three years before he joined Trinity College Dublin (TCD) in 2009. He is now an Associate Professor at the School of Physics, TCD and a Principal Investigator at CRANN. His research is focused on the applications of helium-ion microscopy in nanomaterial imaging and modification.
Prof Ken Durose - Grain boundaries in thin film solar cells
Prof Jaime Gomez Rivas - Semiconductor and metal nanoantennas: Directional emitters and absorbers of polarized light probed by Fourier microscopy
Prof James LeBeau - Quantitative Characterization of Semiconducting Materials with STEM
Dr Anna Mogilatenko - Study of defect density and compositional homogeneity in AlN/AlGaN layers for application in UV emitters
Prof Yutaka Ohno - Grain boundary segregation in Si studied by atom probe tomography combined with TEM and ab-initio calculations
Prof Xiong Qihua - Fluorescence and Raman sideband cooling in II-VI semiconductors nanostructures
Dr Pierre Ruterana - Atomic structure of extended defects in wurtzite semiconductors
Dr Ana Sanchez - Non-radiative Ʃ3 (112) Boundaries in Semiconductor Nanowires
Prof Takashi Sekiguchi - SEM cathodoluminescence and EBIC study of widegap semiconductor materials and devices
Prof Kerstin Volz - Atomically resolved insights into semiconductor heterointerfaces
Prof Hongzhou Zhang - Helium ion microscopy for two-dimensional semiconductor applications
The registration fees are as follows:
Standard rate £575
RMS/IoP Member rate £475
Student rate £325
RMS/IoP Student Member rate £280
Registration fee includes all lunches and refreshments for the 4-day meeting, 3 evening meals, a banquet dinner, wine reception and an abstract booklet.
Accommodation is £75 a night including bed and breakfast for a en-suite room. For details on how to book this please see below.
Venue for the meeting
MSM XX is taking place at Lady Margaret Hall (LMH), Norham Gardens, Oxford OX2 6QA
The accommodation is also located at Lady Margaret Hall.
To find out more information about the college, please visit the Lady Margaret Hall website.
Travelling to the venue
LMH is a short walk from Oxford city centre and as such, due to its location, there is no parking available. It is therefore strongly advised to use public transport or taxis.
Oxford has 2 train stations, both with direct links to London.
Oxford also has regular coach services to and from Heathrow, Gatwick and Birmingham Airport.
Accommodation is not included in your registration fee; however, the RMS has made arrangements for you to book your own accommodation to stay at LMH at a preferential rate of £75 a night.
To book your accommodation please visit http://conference.lmh.ox.ac.uk/accommodation/. Please use the Promotional code MSM2017 and select the dates which you would like to book.
Please note that you are only able to book accommodation with a credit/debit card. There is not an option to raise an invoice.
Dietary and Access requirements
The RMS is committed to our delegates’ health and wellbeing. Therefore, if you have any dietary or access requirements please contact Karina Lang.
Lady Margaret Hall, Oxford, OX2 6QA
Leica UK Ltd
Leica Microsystems is a leading manufacturer and supplier of high precision optical solutions based on microscopes and related instruments. The company manufactures a comprehensive portfolio of products used in a wide variety of areas requiring vision, measurement and analysis, including applications in the life sciences (such as bio-technology research and medicine) and the material sciences.