Advances in Microscopical Imaging - Applications in Forensics

Location:

Shrivenham

Date:

17 October 2006

Contact:

Allison Winton

Tel:

01865 254760

Fax:

01865 791237

Email:

allison@rms.org.uk

Website:

none

This event has been postponed until further notice. It will be rescheduled in 2007.

To receive notification of the new date of this meeting please contact Allison Winton

Event Description

Organiser: Jonathan Painter, Cranfield University, Shrivenham  
 
This meeting builds on the success of the two previous meetings, "Applications of Microscopical Techniques in Forensic Science" held in June 2001 and “Forensic Electron Microscopy – Spreading Best Practice” held in June 2003.  
 
Developments in both microscopical and spectroscopic imaging technologies have greatly increased their potential for sample analysis. The meeting will introduce the latest imaging technologies and highlight their respective capabilities with particular reference to their use, or potential use, in forensic applications.  
 
A panel session is planned to address the issues of dissemination and uptake of best practice in forensic electron microscopy.

Registrants are invited to submit abstracts (up to 150 words) for consideration as oral or poster presentations.  
The abstract deadline is Tuesday 12 September 2006.  
Please email your abstract as a Word document to Allison Winton 

For details of how to get to this venue click here

Event Programme

This meeting will feature the following speakers: 
 
Patrick De Smet - National Institute for Forensic Science, Belgium 
Forensic applications of white-light profilometry 
 
Alan Brooker – Renishaw 
Use of their combined SEM and Raman in forensics 
 
Kim Simpson - DSTL  
Three decades of SEM/EDS at the United Kingdom Forensic Explosives Laboratory 
 
David James 
Raman Microscopy (title to be confirmed) 
 
Speaker to be confirmed - Malvern Instruments Ltd 
The Technology and Applications of Near-Infrared Chemical Imaging