M1.1 Applications of aberration corrected TEM/STEM
Organised by Prof. Andrew Bleloch (University of Liverpool) and Prof. Joachim Mayer (RWTH Aachen)
Aberration corrected TEM instrumentation has reached maturity within a very short time and is now revolutionising applications in many different fields. The session will focus on the latest developments in the applications of ultra-high spatial resolution imaging and analysis. Contributions are expected to relate to prospects of aberration correction in all relevant methods based on TEM and STEM imaging, diffraction and spectroscopy. Examples for applications include the whole range of nano-particles and nano-objects as well as investigations of lattice defects, internal boundaries and nanostructures in all types of structural, functional and electronic materials.
Speakers
- Dr. Alexandre Gloter (University Paris Sud) EELS with aberration corrected STEM
- Dr. Christian Kisielowski (University of Berkeley, USA) Electron microscopy has reached 0.5 Å resolution. What is next?
M1.2 Applications of FIB Microscopy
Organised by Dr. Beverley Inkson (University of Sheffield)
Focused ion beam (FIB) microscopy is currently undergoing a rapid and exciting expansion of applications and instrumentation. This symposium is aimed at advances in both Ga ion FIB and the new He ion FIB. Joint with the UK NanoFIB network, the session will be an excellent opportunity for discussing developments and networking.
Speakers
- Dr. Paul Alkemade (TU Delft) Nanopatterning with a helium ion microscope
- Dr. Geoff West (University of Loughborough) 3D Microstructural Characterisation of Alloy Systems using Combined EBSD and EDS Analysis in a Dual Beam FIB
M2.1 3D reconstruction in Materials Science
Organised by Dr. Guenter Möbus (University of Sheffield) and Dr. Paul Midgley (Cambridge University)
A variety of microscopy techniques have been recently developed which allow us to reconstruct the 3D microstructure of materials with µm or nm-scale resolution. This symposium addresses the full spectrum of these developments, such as electron versus X-ray techniques, coherent versus incoherent radiation, imaging versus diffraction data, structural versus chemical mapping, etc. Topics related to methods are invited in areas such as reconstruction algorithms, software, data collection routines, and quantification of results. Materials application related topics will also be covered, e.g. nanoparticles, 1D nanostructures, nanocomposites, porous materials, along with their micron-scale equivalents.
Speakers
- Dr. Ute Kolb (University of Mainz) Accessing the crystal structure of nano particles “ab initio” by automated electron diffraction
- Dr. Thierry Epicier (INSA, Lyon) STEM-HAADF tomography and generalized stereoscopy 3D studies of nano-particles in Transmission Electron Microscopy
M2.2 Advanced SEM: applications and techniques
Organised by Dr. Debbie Stokes (FEI) and Prof. Ed Boyes (University of York)
The scope for characterisation using Scanning Electron Microscopy continues to evolve and grow as we seek a more sophisticated understanding of the physics and chemistry of materials at the meso- and nano-scales. This symposium will explore the latest applications and techniques that exploit advances in technological capabilities, either of the microscope itself or peripheral equipment or software, giving new perspectives on surface and bulk structure and properties.
Speakers
- Prof. Colin Humphreys (University of Cambridge) Applications of Advanced SEM to solving key problems in Semiconductors: from Dopant Contrast to CL
M3.1 Electron Spectroscopy
Organised by Prof, Mark Rainforth (University of Sheffield) and Prof, Rik Brydson (University of Leeds)
Recent advances in microscope and spectrometer designs have greatly enhanced the information available from electron spectroscopy techniques. The use of monochromated electron beams has reduced energy spread significantly, which, in parallel with the improvement in spectrometer design, has resulted in greatly enhanced resolution of electron loss near edge structure. Similarly, aberration correction of the electron probe has greatly improved spatial resolution from which EELS or EDS spectra can be obtained. This session will cover all aspects of the latest advances in electron spectroscopy, including issues such as the ability to get atomic resolution spectroscopy, and will compare electron spectroscopy with other spectroscopies such as microfocus X-ray spectroscopy in the synchrotron.
Speakers
- Dr. Johan Verbeeck (University of Antwerp) Atomic resolution EELS: hitting the physical limits?
- Prof. Dr. Gerald Kothleitner (Graz University of Technology) Towards More Quantitative EELS: Possibilities with a Novel Electron Energy-loss Spectrometer
M3.2 Nano-whatnots: dots, wires, tubes and sheets.
Organised by Dr. John Hutchison (Oxford University) and Dr. Jeremy Sloan (University of Warwick)
“Small is beautiful” and “nano-” – extremely small – is, for a microscopist, extremely beautiful. The last few years have seen an explosive growth in the assembly and study of nanostructured materials which are now being assembled on the atomic scale. These novel structures present wonderful opportunities and challenges for microscopists, while at the same promising a new and exciting world of faster communication, quantum computers, and a huge variety of nano-scale devices.
This symposium will present an overview of this rapidly developing field, with specific examples showing how different microscopic techniques are proving to be crucial tools with which to explore this new world.
Speakers
- Dr. Nguyen TK Thanh (UCL) Design, synthesis, characterisation of novel magnetic nanoparticles for biomedical applications
- Prof. Ute Kaiser (University of ULM) Microscopy at the bottom
