Events > Past RMS Events > 2011 Events > Aberration Corrected & Quantitative (S)TEM & Advances in Tomography III
Aberration Corrected & Quantitative (S)TEM & Advances in Tomography III
2 one day workshops
| Starts on | 11/04/2011 |
| Ends on | 12/04/2011 |
| Category | Electron Microscopy |
| Location | University of Sheffield, UK |
Scientific Organisers: Guenter Moebus (University of Sheffield, UK) and Paul Verkade (University of Bristol, UK)
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Aberration Corrected & Quantitative (S)TEM
This workshop includes:
- Aberration Correction for TEM & STEM
- Monochromation and energy filters
- Novel camera systems
- Image processing and simulation
Advances in Tomography III
This workshop includes:
- Multidisciplinary Tomography
- X-rays, Electron beams, Impedence, Emission based Acquisition & projection geometries, data collection
- Missing information
- Reconstruction algorithms
- Diffraction Tomography
Exhibitors & Sponsors
further information
If you have any questions regarding these workshops please contact Victoria Lee.