Skip navigation |

Aberration Corrected & Quantitative (S)TEM & Advances in Tomography III

2 one day workshops

Starts on11/04/2011
Ends on12/04/2011
CategoryElectron Microscopy
LocationUniversity of Sheffield, UK

Scientific Organisers: Guenter Moebus (University of Sheffield, UK) and Paul Verkade (University of Bristol, UK)

Download the Programme

Aberration Corrected & Quantitative (S)TEM

This workshop includes:
- Aberration Correction for TEM & STEM
- Monochromation and energy filters
- Novel camera systems
- Image processing and simulation

Advances in Tomography III

This workshop includes:
- Multidisciplinary Tomography
- X-rays, Electron beams, Impedence, Emission based Acquisition & projection geometries, data collection
- Missing information
- Reconstruction algorithms
- Diffraction Tomography

Exhibitors & Sponsors

Agar Scientific digisens logo

Gatan Logo

Hitachi Logo VSG logo

further information

If you have any questions regarding these workshops please contact Victoria Lee.