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Location:
University of Sheffield
Date:
23/06/2005 - 23/06/2005
Contact:
Victoria Lee
Tel:
01865 248768
Fax:
01865 791237
Email:
victoria@rms.org.uk
Event Description
Scientific Organisers:
Per Bullough, Tony Cullis, Gnter Mbus, Mark Rainforth, John Rodenburg, Ian Ross
An annual event to present and discuss latest progress, forthcoming developments, practical and operational issues, including software and peripheral devices (EDX, EELS), related to FEGTEM and FEG-STEM microscopy in both biological and materials sciences.
Invited and Contributed Speakers will cover a range of topics including:
Aberration Corrected FEGTEM and STEM
Progress in Quantitative TEM and Data Analysis
Applications in Biological FEGTEM
Applications in Materials Science/Semiconductors
Confirmed Speakers Include:-
Professor John Trinick, School of Biomedical Sciences, University of Leeds - Use of Leginon automation software with the Tecnai F20 microscope
Professor Josef Zweck, Institute for Theoretical Physics, University of Regensburg - Deep insights into magnetism on a nanometre scale
Dr Andrew Bleloch, SuperSTEM Facility, CLRC Daresbury
Dr Angus Kirkland, Department of Materials, University of Oxford - Direct and indirect correction and compensation of aberrations for HRTEM
The final 30 minutes of the meeting will allow for manufacturers presentations of the latest and forthcoming next generation equipment and accessories.
Registrants are invited to submit abstracts of up to 200 words in length, for consideration as oral or poster presentations. Abstracts should be submitted via email to victoria@rms.org.uk.
FEGTEM 7 is running in conjunction with the Advances in Tomography Meeting, which is being held the following day, Friday 23 June 2005
This Meeting has been sponsored by:-
EMAG, FEI Company, GATAN, JEOL, Soft Imaging Systems and ZEISS
