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MSM XVI
Location:
Keble College, Oxford
Date:
17 March 2009 - 20 March 2009
Contact:
Victoria Lee
Tel:
01865 254760
Fax:
01865 791237
Email:
victoria@rms.org.uk
Website:
http://www.rms.org.uk/event_MSM09.shtml
Conference Co-Chairmen
John Hutchison (Oxford)
Pete Nellist (Oxford)
Thomas Walther (Sheffield)
Tony Cullis (Sheffield)
Registration for residential delegates to this event is now open
The residential package includes accommodation at the event venue and is at an extremely competitive rate. All meals, including the banquet, are included in this package and you will be on site for the duration of the event.
Registration for day package (non-residential) delegates is open now
The day delegate package include 4 days attendance at the meeting, refreshments, lunches and the option to attend conference dinner on the Thursday night.
You will need to secure your own accommodation.
Registration for individual days (non-residential) is now open
The individual day registration allows you to attend the conference only for the days that you specify. Accommodation is NOT included in this package.
The Proceedings of this conference will be published as an online citable resource that all delegates will have access to, and this is included in the registration fee. You will also receive a copy of the conference Proceedings on DVD.
At the Conference you will have the opportunity to pre-order a book of the Proceedings at an additional charge.
Instructions for the Preparation of Papers for Publication in the Proceedings of MSMXVI (2009)
The Proceedings of the MSMXVI conference will be published on the web in Journal of Physics: Conference Series (IOP). All authors presenting a paper, whether oral or poster, are invited to prepare a written version for publication in the Proceedings. All submitted work should be prepared as for display on A4 paper, and should be typed, if possible, using Word 2003: later versions of Word are acceptable if Word 2003 is not available. Please do NOT provide .pdf copies or use Latex for the preparation of manuscripts. Invited papers are allocated 10 journal pages and contributed papers 4 journal pages: authors should contact one of the conference Chairmen if they need to exceed these page allocations. Full additional paper format instructions and guidelines can be found on the web using the url:
http://ej.iop.org/pdf/jpconf/jpcswordguidelines.zip
Please bring your completed papers to the conference: a soft copy on CD and 3 printed copies are requested. Refereeing of papers will start immediately and authors should look out at the conference for messages requesting them to come to the Editorial desk.
If you are interested in purchasing a copy of either the 2007 or 2005 Proceedings at 25 per copy, please email victoria@rms.org.uk
Parking
Unfortunately we cannot secure parking for delegates during this Conference. Oxford has very limited parking and is not car friendly. Generally all visitors to the city are advised to travel by public transport. We have excellent rail connections and a very good bus service from London and its major airports.
Keble College has no delegate parking available.
Event Description
Endorsed by EMAG, Institute of Physics
Endorsed by the Materials Research Society
The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy and X-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.
The main topic areas to be covered are as follows:
*The characterisation of as-grown semiconductors in both bulk and thin film forms.
*The study of nanostructures of all types from quantum dots, wires, etc to nanotubes.
*The investigation of lattice defect and impurity behaviour in semiconducting materials.
*The study of the effects of semiconductor processing treatments: oxidation, nitridation, ion implantation, annealing, silicidation, etc.
*The assessment of finished electronic devices, including studies of the influence of structural defects upon their behaviour and important new design features such as high/low-k dielectrics, etc.
*Developments in the use of high resolution imaging and analytical transmission electron microscopy
*The exploitation of advanced scanning techniques: SEM-EBIC, SEM-CL, etc; STM, AFM, SCM, etc.
ABSTRACT SUBMISSION
The abstract submission deadline has passed.
If you have any queries regarding abstracts please email victoria@rms.org.uk
Event Accommodation
Accommodation is included in the delegate package for the nights of 17th, 18th and 19th March 2009.
If you require rooms for additional nights, please contact victoria@rms.org.uk
Exhibiting Companies
Event Programme
Click here to download the provisional programme for 2009
Please note, only presenting authors are shown on the programme, all other authors will be given in the abstract booklet.
This is a provisional programme and some details may be subject to change.
If you have any queries regarding this programme, please email victoria@rms.org.uk
Invited Speakers
Dr D Bell (Harvard University, Cambridge, USA)
The Emerging Application of He+ Ion Microscopy to Semiconductor Technologies
Dr E Carlino (TASC, Trieste, Italy)
Quantitative Z-Contrast Atomic Resolution Studies of Semiconductor Nanostructured Materials
Prof D Cherns (University of Bristol, UK)
GaN Devices Based on Nanorods
Prof A Craven (University of Glasgow, UK)
STEM-EELS Investigations of High-k Dielectrics
Prof R Dunin-Borkowski (Technical University of Denmark)
Prospects and Challenges for Electron Holography of Doped Semiconductors
Prof D Gerthsen (University of Karlsruhe, Germany)
On the Incorporation of Indium in InAs-Based Quantum Structures
Dr F Glas (CNRS-LPN, France)
TEM of Growth, Structure and Phase Transitions of Epitaxial III-V Nanowires
Dr M Hecker (AMD, Dresden, Germany)
Strain Analysis by NanoRaman Spectroscopy in Si Structures for CMOS Technology
Prof R Hull (Rensselaer Polytechnic Institute, Troy, New York)
Templated Assembly of Epitaxial Semiconductor Nanostructures
Dr C Kisielowski (Berkeley, USA)
Observing cluster Formation in InxGa1-x N Alloys and its relation to Detection Limites for Single Atoms
Prof S Kodambaka (UCLA, USA)
Role of Al in Au-Catalysed Growth of Si Nanowires
Prof S Molina (University of Cadiz, Spain)
Exploring Semiconductor Quantum Dots and Wires by High Resolution Electron Microscopy
Prof S Tsukamoto (Anan National College of Technology, Japan)
Investigations of InAs QD Formation on GaAs (001) by in situ STM during MBE Growth
Dr W Vandervorst (IMEC, Leuven, Belgium)
Nanoscale Analysis of Planar and 3D Si Structures
The RMS Annual Materials Lecture will take place on 18th March, and will be given
by Prof J Silcox (Cornell University, Ithaca, USA).
Materials Research with the Next Generation of Electron Microscopes
NanoFIB 2008, 16 March 2009, Oxford
This one day meeting will concentrate on both the latest applications of the FIB technique and also the state-of-the-art in instrument development. The abstract deadline is 30 January 2009. Further information about the meeting and abstract submission can be obtained from the RMS or the meeting Chairperson Beverley Inkson.
