This page was created by Cubik's Content Migrator for MCMS.
For your reference, this page was migrated from:
http: // www.rms.org.uk / event_nano07.shtml
Delete this message as part of your post-migration clean-up process.
NanoFIB 2007
Location:
Materials Science Centre, University of Manchester, UK
Date:
29 June 2007
Contact:
Victoria Lee
Tel:
01865 254769
Fax:
01865 791237
Email:
victoria@rms.org.uk
Website:
none
Registration has now closed
Organisers:
Richard Langford, Manchester
Beverley Inkson, Sheffield
This meeting is Co-Supported by the EPSRC NanoFIB network : http://www.nanofib.org
Event Description
Focused ion beam (FIB) microscopy is a unique interactive tool for the in-situ, site-specific nanomachining and microstructural analysis of nanostructures. There is dramatic growth in FIB activity in areas such as direct device processing, 3D micromachining, nanopatterning, biological and nanomaterials analysis.
This one-day meeting is aimed at both current and future FIB users, covering the latest exciting FIB developments in the areas of nanoprocessing and nanoanalysis techniques, and state-of-the-art FIB instrumental development. Important topics will be highlighted in keynote presentations,
Abstracts for short oral and poster contributions (200 words in length) are invited, including in the FIB technology areas of:
Semiconductor devices and failure analysis
Novel 3D micromachining applications and tool manufacture
Nanopatterning and nanocircuits
Biological applications of FIB
Specimen preparation methods for nanoanalysis
Instrumentation development
Abstract deadline: 22nd June 2007
Registration deadline: 22nd June 2007
To submit an abstract for this event, click here
Event Programme
Confirmed Speakers
Dr Victor Callegari, EMPA, Switzerland
- Focused ion beam micro- and nanostructuring of photonic crystals
Dr Susan Turnbull, Dept. Physics & Astronomy, The University of Glasgow, UK
- Applications of Dual Beam FIB in Nanomagnetics
Dr Peter Gnauck, Carl Zeiss GmbH, Germany
- High sensitive SIMS on frozen organic samples
There will also be two 1 hr hands-on FIB training sessions on the in situ lift-out technique run during the one day meeting.
More information will be available here soon.
