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NanoFIB 2009
Location:
Wadham College, Oxford
Date:
16 March 2009
Contact:
Victoria Lee
Tel:
01865 254769
Fax:
01865 791237
Email:
victoria@rms.org.uk
Website:
Registration for this event is now open
Event Description
Focused ion beam (FIB) microscopy is a unique interactive tool for the in-situ, site-specific nanomachining and microstructural analysis of nanostructures. There is dramatic growth in FIB activity in areas such as direct device processing, 3D micromachining, nanopatterning, biological and nanomaterials analysis.
This one-day meeting is aimed at both current and future FIB users, covering the latest exciting FIB developments in the areas of nanoprocessing and nanoanalysis techniques, and state-of-the-art FIB instrumental development. Important topics will be highlighted in keynote presentations,
Abstracts for short oral and poster contributions (200 words in length) are invited, including in the FIB technology areas of:
Semiconductor devices and failure analysis
Novel 3D micromachining applications and tool manufacture
Nanopatterning and nanocircuits
Biological applications of FIB
Specimen preparation methods for nanoanalysis
Instrumentation development
This meeting precedes the MSMXVI Conference, which is taking place over four days at Keble College, Oxford. To see the details of the conference please click here.
Abstracts for poster presentation are being accepted for this meeting.
Please email your abstract as a Word Document of 200-300 words to victoria@rms.org.uk
Submission deadline: Friday 30th January 2009
Exhibiting Companies
Event Programme
2009 Programme:
1st Invited Speaker Confirmed
Dr David C. Bell, Harvard University
Click here to download the 2007 programme.
