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Location:

University of Swansea

Date:

30 March 2009 - 31 March 2009

Contact:

Clare Oxenbury

Tel:

01865 254768

Fax:

01865 791237

Email:

clare@rms.org.uk

Website:

none

Abstract Deadline has been extended by 1 week to Friday 20th February

Event Description

This event is co-sponsored by the Institute of Materials

Organiser:
Valerie Randle
University of Swansea

The meeting provides a forum for EBSD users (old and new) to discuss the most recent ideas and innovations in EBSD and related techniques. Previous meetings have generated strong interactions between users from different backgrounds (physics, earth sciences and material sciences).
The participants will have an opportunity to meet representatives from some of the leading equipment and software manufacturers in the field of EBSD and to obtain information on their products.

Contributed Papers
Contributions on developments or applications of EBSD and related techniques are invited for either oral or poster presentation. Abstracts of approximately 200 words should be emailed in A Word Document to clare@rms.org.uk. The deadline for submissions is 13th February 2009.

Abstract Deadline has been extended by 1 week to Friday 20th February

The registration fee includes a basic en-suite student room with breakfast, conference dinner and refreshments. You have a choice of whether to stay for 1 or 2 nights.
If you need an extra night please contact clare@rms.org.uk.

Event Programme

The conference will start with registration from 9.30 to 10.30 on Monday 30th March and will end on Tuesday 31st March at 4.30pm.

Confirmed Speakers include:

Professor Anthony Rollett, Carnegie Mellon University
Analysis of 3D EBSD images

Professor Robert Schwarzer, Technical University, Clausthal
Orientation microscopy with Fast EBSD
AND
Ion blocking patterns as an alternative to EBSD

Dr Carol Trager-Cowan, Strathclyde University
Electron Channeling Contrast Imaging of Defects in Nitride Semiconductor Thin Films

Alice Bastos da Silva, Technical University of Denmark
Characterization of nanostructured material by EBSD: possibilities, compromises and limits

Greg Rohrer, Carnegie Mellon University
Measuring the Five Parameter Grain Boundary Character Distribution From Three-Dimensional Orientation Maps

Dave Prior, Liverpool University
Tracking the deformation of grains using time-series EBSD