Expertise
Imaging Platforms
Keywords - Electron Microscopy: Transmission EM | Scanning Transmission EM | Scanning EM (FEG) | Focused Ion Beam SEM
The EM RTP has a range of instruments suitable for different purposes and experiments. ZEISS SUPRA FEGSEM, ZEISS GEMINI FEGSEM, TESCAN FIBSEM, JEOL 2100 TEM, JEOL ARM200F Aberration-Corrected TEM, JEOL 2100plus TEM, Bruker AFM, ZEISS Optical
Applications
Keywords - Physical Sciences: Electron Optics | Functional oxides | Semiconductors and optoelectronics | Nanomaterials | Magenetics, magnetic materials & spintronics | Catalysts | Polymers and organic electronics
Sample Preparation
Keywords - Materials: Argon ion thinning | Focussed ion beam (Gallium) | Focussed ion beam (Other)
Data Analysis
Keywords - Software: Digital Micrograph/ GMS | AxioVision
Shared Access
The EM RTP has strong links with both industry and other higher education institutions, helping to image, analyse and solve problems for a range of clients. We can offer advice, set up a plan of work and implement it to give you the information you need about a sample.
We have many years of expertise in electron microscopy and analysis and are able to assist with any investigations you may wish to carry out. If you have an investigation or experiment you would like to carry out, we would be happy to discuss details.