09 April 2017 - 13 April 2017

The 20th Microscopy of Semi Conducting Materials will take place in Oxford in 2017.

The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy, X-ray topography and diffraction will also be featured.

Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.

Registration has now closed. If you have any queries please contact Karina Lang.


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