David Cockayne Centre for Electron Microscopy

The David Cockayne Centre for Electron Microscopy is based within the Department of Materials at the University of Oxford. It consists of a range of scanning electron microscopes, transmission electron microscopes and focus ion beam instruments. It also hosts the South of England Analytical TEM instrument. The instruments are supported by a team of dedicated research support and technical staff. The principal focus is on physical science problems, but some life-science work is undertaken.



Expertise

Imaging Platforms

Keywords - Electron Microscopy: Transmission EM | Scanning Transmission EM | Scanning EM (Tungsten) | Scanning EM (FEG) | Focused Ion Beam SEM

Transmission: JEOL ARM-200F STEM, JEOL JEM-3000F FEGTEM, JEOL JEM-2100, JEOL JEM-2200MCO FEGTEM, JEOL JEM-2010, JEOL JEM-2000FX

Scanning: Hitachi TM3000, JEOL JSM-5510, JEOL JSM-6480LV, JEOL JSM-6500F, JEOL JSM-840F, JEOL JSM-840A, Zeiss Merlin Analytical, Zeiss Merlin – EBSD, Zeiss EVO, JXA-8800 microprobe

Focussed Ion Beam: FEI FIB200, Zeiss NVision 40 FIB-SEM, Zeiss Auriga FIB-SEM

Applications

Keywords - Physical Sciences: Bioengineering and biomaterials | Electron Optics | Metallurgy / alloy development | Corrosion / oxidation | Functional oxides | Semiconductors and optoelectronics | Nanomaterials (nanoparticles, 2D nanomaterials, nanowires and nanotubes) | Composites | Optical and photonic materials and devices | Magnetics, magnetic materials and spintronics | Catalysts | Polymers and organic electronics | Ionic conductors, fuel cells and batteries

Sample Preparation

Keywords - Materials: Argon ion thinning | Focussed ion beam (Gallium) | Electropolishing| Tripod polishing

Data Analysis

Keywords - Software: ImageJ | Amira | Matlab | Digital Micrograph / GMS | HR-STEM simulation packages (various) | HRTEM simulation packages (various) | Other Image simulation for crystals | Hyperspy


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