16 Mar 2022

RMS Saddened to learn of death of Professor Tony Cullis Hon FRMS

Honorary Fellow’s expertise in electron microscopy was internationally recognised

The RMS was saddened to learn of the death of Professor Tony Cullis Hon FRMS, a leading figure in the international electron microscopy community whose research was at the forefront of microstructural characterisation of electronic materials.

Tony obtained his doctorate from Oxford University and moved to Bell Laboratories (Murray Hill, USA) in the early 1970s, before returning to the UK, where he became head of the microscopy group in the Materials Division at DRA Malvern.

He served on the RMS Council during the 1990s, and contributed greatly to the work of the Society. For many years he organised the Microscopy of Semiconducting Materials conferences, which became an essential forum for the latest research in the field. His research and expertise was internationally recognised, including his pioneering development of TEM preparation techniques for characterising defect structures in those materials.

Tony received the RMS Honorary Fellowship in 2016 for his ground-breaking experimental work on the properties on nano-structured semiconducting materials, determined primarily by the combined use of various TEM techniques.  

Tony sadly passed away in December 2021. He will be greatly missed by many across the international microscopy community, and the RMS would like to offer its sincere condolences to Tony’s family.