10 June 2017 Issue
Exploring functional material behaviour with voltage modulated atomic force microscopy modes
In this article by Sabine Neumayer of University College Dublin, an overview of voltage modulated techniques is provided and their operational principles and capabilities are discussed.
Understanding functional properties of materials is key to a variety of applications in materials science and engineering. Voltage modulated atomic force microscopy modes have enabled insight into functional behaviour and interface phenomena including electromechanical coupling, electrochemical processes and charge distribution, which can be
correlated to structural information obtained from topography.
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