International Microscopy Focus Lecture Series prepares for lift-off!
Opening instalment (26 October) to feature Sir Peter Hirsch in conversation with Peter Nellist
An exciting new webinar series aimed at expanding knowledge and sharing best practice in microscopy is set to begin later this month.
The International Microscopy Focus Lecture Series kicks off on Tuesday, 26 October, with its first guest speaker, Professor Sir Peter Hirsch.
Sir Peter will feature in a recorded conversation with Professor Peter Nellist, entitled: 'A historical account of the impact of TEM in Materials Science'.
The International Focus Lecture Series is part of a collaboration between three international Microscopy Societies (the Microscopical Society of Canada, the Israel Society for Microscopy and the Royal Microscopical Society) and it is supported also by the International Federation of Societies for Microscopy (IFSM).
The International Microscopy Focus Lecture Series