Science Section gets new name

SPM Committee renamed ‘AFM and Scanning Probe Microscopies’ to better reflect range of techniques covered

The Society's SPM Section has been renamed AFM and Scanning Probe Microscopies, following discussions over how best to reflect the range of techniques it represents.

Section Chair Sonia Contera said: “The change of title reflects the fact that atomic force microscopy (AFM) has become the predominant SPM technique, and that many newcomers to the rapidly expanding community of the AFM technique users have never come across the  term “scanning probe microscopy”, and even less the acronym “SPM”. The new title will allow new AFM users to recognise us in an easier manner, it reflects the impact of AFM and recognises the diverse family of scanning probe microscopies across wide academic and industrial communities.”

Find out more about the AFM and Scanning Probe Microscopies Section

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