Speakers
Invited Speaker
Dr Jochen Bruckbauer
Department of Physics, University of Strathclyde, Glasgow
Dr Jochen Bruckbauer is a Research Fellow in the Advanced Materials Diffraction Lab in the Department of Physics, University of Strathclyde, Glasgow. He specialises in advanced electron microscopy and optical spectroscopy for the characterisation of semiconductors, with particular interest in novel nitride semiconductors and their nano- and microstructures. He has extensive expertise in electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for high-resolution, high-sensitivity structural analysis of semiconductors and their extended defects. His work integrates correlated measurement techniques, such as cathodoluminescence hyperspectral imaging, energy-dispersive X-ray spectroscopy (EDX), and electron beam-induced current (EBIC).