Speakers
Invited Speaker
Industrial non-destructive testing relies heavily on inline, attenuation-based X-ray radiography. With dedicated setups, additional contrasts can also be recovered, such as phase contrast. Combining phase-sensitive X-ray techniques with full 3D reconstructions has the potential to significantly enhance the information gained during inspection. While a 2D inline acquisition method has previously been demonstrated using a modified edge illumination phase contrast setup to retrieve both attenuation and phase contrast from an illumination curve, extending this approach to 3D remains challenging. It requires a novel acquisition scheme that simultaneously integrates sample translation, rotation, and illumination curve sampling. In this presentation, I will propose a flexible inline edge illumination CT method that facilitates this extension without hardware modifications, while offering freedom in parameters such as the number of projection angles and illumination curve points. Through a realistic simulation study, we show that the proposed method can be applied for inline inspection without increasing the number of required projections compared to conventional edge illumination X-ray imaging.Industrial non-destructive testing relies heavily on inline, attenuation-based X-ray radiography. With dedicated setups, additional contrasts can also be recovered, such as phase contrast. Combining phase-sensitive X-ray techniques with full 3D reconstructions has the potential to significantly enhance the information gained during inspection. While a 2D inline acquisition method has previously been demonstrated using a modified edge illumination phase contrast setup to retrieve both attenuation and phase contrast from an illumination curve, extending this approach to 3D remains challenging. It requires a novel acquisition scheme that simultaneously integrates sample translation, rotation, and illumination curve sampling. In this presentation, I will propose a flexible inline edge illumination CT method that facilitates this extension without hardware modifications, while offering freedom in parameters such as the number of projection angles and illumination curve points. Through a realistic simulation study, we show that the proposed method can be applied for inline inspection without increasing the number of required projections compared to conventional edge illumination X-ray imaging.
Jitse Verstraete is a PhD Researcher in the imec-VisionLab research group at the University of Antwerp, working under the supervision of Prof. Dr. Jan De Beenhouwer and prof. dr. Jan Sijbers. His research focuses on the development of inline X-ray phase-contrast CT techniques and 4D phase-contrast CT, with an emphasis on joint reconstruction algorithms.