Skip to content
Login
Events
Event Calendar
MicroscopyDB Events Database
The International Microscopy Lecture Series
Microscience Microscopy Congress Series
Event Hosting & Management
RMS Corporate Member Event Hosting
Exhibiting and Sponsorship
Community
Science Sections
AFM & other Scanning Probe Microscopies
Data Analysis in Imaging
Electron Microscopy
Engineering, Physical & Material Sciences
Flow Cytometry
Life Sciences
Light Microscopy
Early Career Committee
Outreach & Education Committee
History Committee
RMS Council
Join a Committee
Focussed Interest Groups
Quality Control
Mass Spectrometry Imaging
X-ray Microscopy
Ion Beam Microscopy
Professional Development and Training
Open Call for members of a new RMS Histology Focussed Interest Group
Networks & Affiliates
BioImagingUK Network
EM-UKI
International Societies & Microscopy Groups
Advanced EM Working Group
Expansion Microscopy User Group
Advanced Electron Microscopy Working Group 2025 Roadmap Refresh
Facilities Database
RMS Facilities Database Submission Forms
EDI&A Group
Corporate Advisory Board
Equity in Microscopy Resource
Technician Commitment
Technician Subsidy
RMS Ambassadors
Promotion Toolkit
Post-event Impact Form
RMS Ambassador Profile
RMS Discussion Groups
Journal of Microscopy
Library
Journal of Microscopy
Editors & Editorial Board
Open Access
Virtual Issues
infocus Magazine
infocus Article Backfile
Online infocus Magazine
Submit to infocus
Editorial Board
infocus Magazine Advertising Opportunities
RMS Books
RMS News
Online Microscopy Resources
MicroscopyDB Training & Education Resources
MicroscopyDB Tools Database
Technical Tea Breaks
Image Analysis Resources
Core Facilities Publication Policy
The Science Heritage Collection of Microscopes
Imaging Facility Publication Guidelines
Opportunities
Awards & Competitions
RMS President's Award
RMS Vice Presidents' Award
The RMS Winton Prize
RMS Section Awards
Chris Hawes Award for Outreach and Education
RMS Scientific Achievement Award
RMS Early Career Award
The Pearse Prize
RMS Beginners' Competition
RMS Scientific Imaging Competition
RMS Award Application
RMS Diploma
RMS Diplomates
Current Diploma Projects
Jobs
Professional Development
Summer Studentships
Professional Internship Placements
Technician Subsidy
Application Coaching & Personal Mentoring Schemes
Microscopist, Analyst and Cytometrist Profiles
RMS Annual Call for Images
Technical Specialist Job Shadowing Program
Partnership Opportunities
Outreach
Microscope Activity Kits
What is a Microscope Activity Kit?
Primary School Request a Microscope Activity Kit
Home Educators Request a Microscope Activity Kit
RMS Microscope Activity Kit Feedback Form
Microscope Activity Kit Resource Library
Microscopes for Schools
Hitachi Global STEM Outreach Project portable SEM
Resources for School Children
Outreach Events
Corporate
Corporate Membership
RMS Corporate Members
Corporate Advisory Board
Exhibiting and Sponsorship
Corporate Member Event Hosting
RMS Advertising Opportunities
infocus Magazine Advertising Opportunities
Membership
Join Online
RMS Fellowship
Bursaries
RMS Standard Travel Bursaries
RMS Virtual Bursaries
Public Engagement and Outreach Bursaries
Care & Support Grants
Submit a Member Profile
Corporate Membership
RMS Member Directory
About
Contact Us
Governance
RMS Executive Committee
RMS Council
Rules, Charter and By-laws
RMS AGM
RMS Annual Report
Long-Term Strategy
History of the RMS
Past Presidents
RMS Patrons
Current RMS Honorary Fellows
Past & Present Honorary Fellows
Leave a Legacy
Donate your Microscopes
Working at the RMS
Login
You are here:
Homepage
Past Events
Understanding Radiation Beam-Damage during Cryo-, ETEM, Gas- and Liquid-Cell Electron Microscopy
Free
Understanding Radiation Beam-Damage during Cryo-, ETEM, Gas- and Liquid-Cell Electron Microscopy
14:08 – 14:08 BST
6 August 2017
+ Add to calendar
St Louis, USA
Free
Understanding Radiation Beam-Damage during Cryo-, ETEM, Gas- and Liquid-Cell Electron Microscopy
14:08 – 14:08 BST
6 August 2017
+ Add to calendar
St Louis, USA
Return to listing
Please accept
{{cookieConsents}} cookies
to view this content
