About
This FIG will initially review the current status of FIB and Ion-beam Microscopy in the UK, and provide leadership in developing Ion Beam Microscopy within the RMS/UK.
The initial membership will reflect the first phase of activity, which includes an EPSRC Roadmap on FIB
It's key aims are:
- To act as a focal point for Ion Beam Microscopy Networking in the RMS and UK
- To review the ongoing activity in FIB Microscopy in the UK
- To work with the EPSRC to produce a FIB Roadmap.
The RMS is committed to being a welcoming, inclusive Society and encourages diversity across all activities and in the membership of our committees and groups.
If you are interested in joining any of the groups in the future, please contact Jade Sturdy.
Group Members
Xiangli Zhong FRMS, MIMMM
Xiangli is a Senior Experimental Officer in the School of Materials, University of Manchester. Xiangli obtained her BEng in Metrology Instrumentation and MEng in Materials Science and Engineering. She has registered her PhD since 2006 in National University of Singapore. Xiangli has extensive experience and rich knowledge on electron microscopies, ion microscopies and sample preparation techniques. Her current research interest is on minimising focused ion beam (FIB) induced damages and FIB technical development on various types of materials.
Beverley Inkson
Beverley is Professor of Nanomaterials in The Dept of Materials Science and Engineering at The University of Sheffield, where she leads the NanoLAB Centre. Beverley joined the RMS as a PhD student in Electron Microscopy at Cambridge University, and served on the RMS EM section committee while a Royal Society University Research Fellow. She set up the UK NanoFIB network in 2001, and has run numerous Focused Ion Beam scientific meetings jointly with the RMS.
Beverley’s research interests focus on the use of electron and ion microscopies to quantify the nanomechanical and functional properties of 3D nanomaterials, including developing novel in-situ SPM-TEM and tomographic characterisation methods.
Scott Doak
Scott is a Chartered Engineer and Fellow of the Royal Microscopical Society with over 25 years’ experience in electron microscopy, focused ion beam systems and materials characterisation. Having started as a university technician, his career has spanned both academia and the scientific instrumentation industry.
Scott was previously Director of the Loughborough Materials Characterisation Centre and is currently a Senior Account Manager for Electron Microscopy at Thermo Fisher Scientific.
He has a particular interest in the application of microscopy to engineering and materials science challenges, strengthening links between academia and industry, and has been a strong advocate for technical career pathways and apprenticeships within electron microscopy.
David Cox
Ian MacLaren
Ian MacLaren received a BSc in Physics from the University of Birmingham in 1991 and a PhD in Metallurgy and Materials from the same University in 1995. He has spent his career working on the application of electron microscopy and allied techniques to the characterisation of the structure and chemistry of solid materials of many kinds, including metals and alloys, ceramics, functional oxides, geological and planetary materials, and semiconductors, and in many forms, including bulk materials, thin films, dispersed powders, and artificially created nanostructures and devices. Part of this work has included the critical role played by site specific sample preparation and he recently led the acquisition and installation of a Xenon Plasma Focused Ion Beam system at the University of Glasgow.
Gareth Hughes
Irma Razo
Stuart Robertson
Dr. Stuart Robertson is a senior research fellow and manages the pFIB at Loughborough University, where he supports research and industry to characterise a range material systems including additively manufactured and sintered materials. His work has addressed challenges, in the application of Ion beam and electron microscopy. Following recent EPSRC funding for a new cathodoluminescence detector, his focus has shifted to characterising photovoltaic and semiconductor materials, including CdTe and SiC.