About
This FIG will initially review the current status of FIB and Ion-beam Microscopy in the UK, and provide leadership in developing Ion Beam Microscopy within the RMS/UK.
The initial membership will reflect the first phase of activity, which includes an EPSRC Roadmap on FIB
It's key aims are:
- To act as a focal point for Ion Beam Microscopy Networking in the RMS and UK
- To review the ongoing activity in FIB Microscopy in the UK
- To work with the EPSRC to produce a FIB Roadmap.
The RMS is committed to being a welcoming, inclusive Society and encourages diversity across all activities and in the membership of our committees and groups.
If you are interested in joining any of the groups in the future, please contact Jade Sturdy.
Group Members
Xiangli Zhong FRMS, MIMMM
Xiangli is a Senior Experimental Officer in the School of Materials, University of Manchester. Xiangli obtained her BEng in Metrology Instrumentation and MEng in Materials Science and Engineering. She has registered her PhD since 2006 in National University of Singapore. Xiangli has extensive experience and rich knowledge on electron microscopies, ion microscopies and sample preparation techniques. Her current research interest is on minimising focused ion beam (FIB) induced damages and FIB technical development on various types of materials.
Beverley Inkson
Beverley is Professor of Nanomaterials in The Dept of Materials Science and Engineering at The University of Sheffield, where she leads the NanoLAB Centre. Beverley joined the RMS as a PhD student in Electron Microscopy at Cambridge University, and served on the RMS EM section committee while a Royal Society University Research Fellow. She set up the UK NanoFIB network in 2001, and has run numerous Focused Ion Beam scientific meetings jointly with the RMS.
Beverley’s research interests focus on the use of electron and ion microscopies to quantify the nanomechanical and functional properties of 3D nanomaterials, including developing novel in-situ SPM-TEM and tomographic characterisation methods.
Scott Doak
Scott has been working in electron microscopy and scientific instrumentation for over 30 years and with focused ion beams since 1996. Initially working for FEI (now Thermo), Scott has been Director of the Loughborough Materials Characterisation Centre since 2009. He leads a team of specialists within the core facility who support research and teaching as well as providing industrial consultancy and access for other research institutions. His research interests include FIB technique development, in-situ characterisation, and electron energy filtration within the SEM.
Ian MacLaren
Ian MacLaren received a BSc in Physics from the University of Birmingham in 1991 and a PhD in Metallurgy and Materials from the same University in 1995. He has spent his career working on the application of electron microscopy and allied techniques to the characterisation of the structure and chemistry of solid materials of many kinds, including metals and alloys, ceramics, functional oxides, geological and planetary materials, and semiconductors, and in many forms, including bulk materials, thin films, dispersed powders, and artificially created nanostructures and devices. Part of this work has included the critical role played by site specific sample preparation and he recently led the acquisition and installation of a Xenon Plasma Focused Ion Beam system at the University of Glasgow.