Journal of Microscopy welcomes new Scientific Editors

We are pleased to welcome two new Scientific Editors to the Journal of Microscopy!

Professor Rik Drummond-Brydson (University of Leeds, UK) and Dr Thomas Walther (University of Sheffield, UK) have recently joined the Journal as Scientific Editors. They both bring expertise in materials science and they have been active members of the Journal of Microscopy Editorial Board.

Professor Rik Drummond-Brydson is Chair in Nanostructural Materials Characterisation in the School of Chemical and Process Engineering and the Bragg Centre for Materials Research at the University of Leeds with over 35 years’ research experience in the analytical science of materials. He is Vice President of the Royal Microscopical Society and a former member of the European Microscopy Management Board (2004-2016). His research interests have focused on applying high spatial resolution characterisation methods (particularly TEM and EELS) to the nanochemical analysis of softer, more radiation sensitive materials.

Dr Thomas Walther is a Reader in Advanced Electron Microscopy at the University of Sheffield. He received an undergraduate degree in physics from RWTH Aachen in 1993 and PhD in materials science from the University of Cambridge in 1996/97. Dr Walther was a postdoc at CEA Grenoble, Université d’Aix-Marseille (both in France) and University of Bonn (Germany) where he later became assistant professor in the chemistry department. After a short spell at a new research centre where he set up an electron microscopy lab in the same city, he joined the University of Sheffield as Senior Lecturer in 2006 and was promoted to a readership in 2010. His research focuses on electron microscopy as a fundamental tool to measure chemical changes at the interfaces between different materials with atomic resolution.