This programme is subject to change.  

Tuesday 16 September
10:00 – 11:00
Colin Ophus: 4DSTEM structural characterization of disordered and partially ordered materials

Keynote Speaker

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11:00 – 11:20
Break

General

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11:20 – 11:45
Felix Benneman: Statistical optimisations to direct electron ptychography and their applications

Podium Speaker

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11:45 – 12:10
Mariana Palos: Smart Scanning: Revealing domain wall dynamics in ferroelectrics with in-situ 4D-STEM

Podium Speaker

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12:10 – 12:35
Helen Leung: Medicine at the Nanoscale: 4D-STEM and 3D Electron Diffraction in Pharmaceutical Materials

Podium Speaker

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12:35 – 16:25
Networking Lunch with Posters & Demos

General

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16:25 – 16:50
Eoin Moynihan: Complimentary 4D-STEM and STEM-EBIC Measurement of Electric Fields in Biased Semiconductor Devices

Podium Speaker

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16:50 – 17:15
Tatiana Gorelik: D Electron Diffraction for Structure Characterisation

Podium Speaker

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17:15 – 17:40
Sergio Plana-Ruiz: Serial electron crystallography with a precessed beam

Podium Speaker

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17:40 – 18:00
Daniel Němeček, Tescan

Workshop Sponsor

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18:00 – 19:00
Finish & Social for all attendees - details tbc

General

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Wednesday 17 September
09:00 – 10:00
Penghan Lu: Correlating 4D-STEM with complementary techniques

Keynote Speaker

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10:00 – 10:20
Break

General

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10:20 – 11:10
Ben Britton: Scanning electron diffraction in multiple instruments as an enabler of progress in materials engineering

Keynote Speaker

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11:10 – 11:35
Alex Eggeman: title tbc

Podium Speaker

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11:35 – 12:00
Sean Collins: Quantifying defects and disorder in molecular materials using low-dose scanning electron diffraction

Podium Speaker

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12:00 – 13:20
Lunch

General

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13:20 – 13:45
Mohsen Danaie: Scanning electron nano-beam diffraction at ePSIC, from early days to recent developments on automation

Podium Speaker

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13:45 – 14:10
Laura Clark: Towards Quantitative Interpretation of Ptychographic Imaging

Podium Speaker

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14:10 – 14:35
Peng Wang: Multidimensional and Multimodal 4D STEM Electron Ptychography

Podium Speaker

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14:35 – 15:00
Josh de Boer: Understanding Palladium containing catalysts surfaces through electron ptychographic tomography

Podium Speaker

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15:00 – 15:20
Break

General

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15:20 – 16:20
Judy Kim: 4D-STEM and ptychographic scanning methods for beam sensitive biological materials

Keynote Speaker

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16:20 – 16:30
Wrap up

General

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