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- Workshop on the Applications of 4D-STEM
- Programme
This programme is subject to change.
Tuesday 16 September
10:00 – 11:00
Colin Ophus: 4DSTEM structural characterization of disordered and partially ordered materials
Keynote Speaker
11:20 – 11:45
Felix Benneman: Statistical optimisations to direct electron ptychography and their applications
Podium Speaker
11:45 – 12:10
Mariana Palos: Smart Scanning: Revealing domain wall dynamics in ferroelectrics with in-situ 4D-STEM
Podium Speaker
Wednesday 17 September
09:00 – 10:00
Penghan Lu: Correlating 4D-STEM with complementary techniques
Keynote Speaker
10:20 – 11:10
Ben Britton: Scanning electron diffraction in multiple instruments as an enabler of progress in materials engineering
Keynote Speaker
11:35 – 12:00
Sean Collins: Quantifying defects and disorder in molecular materials using low-dose scanning electron diffraction
Podium Speaker
13:20 – 13:45
Mohsen Danaie: Scanning electron nano-beam diffraction at ePSIC, from early days to recent developments on automation
Podium Speaker
14:35 – 15:00
Josh de Boer: Understanding Palladium containing catalysts surfaces through electron ptychographic tomography
Podium Speaker
15:20 – 16:20
Judy Kim: 4D-STEM and ptychographic scanning methods for beam sensitive biological materials
Keynote Speaker