The Society enjoys an excellent relationship with its corporate members. The Corporate Advisory Board comprises representatives from a range - both in size and interest - of companies. It meets three times a year. The Chair of the Committee is invited to attend meetings of Council and provides invaluable input which is used to shape the Society's approach to its events and associated exhibitions.
The Society is very grateful to the companies that give their time and support.
The members of the Executive Committee are ex-officio members of the CAB.
Committee Chair
Rod Shipley, FEI UK Ltd
Vice-Chair
Huw Thomas, Nikon UK Ltd
Members
Jason Dalby, JEOL UK Ltd
Mike Dixon, Hitachi High Technologies
Gary Edwards, Deben
Robert Forster, Nikon
John Gilbert, Bruker UK Ltd
Bob Hertsens, JEOL Europe BV and ECMA Chair
Rene Hessling, Carl Zeiss Ltd
Lynne Joyce, Agar Scientific Ltd
Chay Keogh, Nikon UK Ltd
Pete Lander, Xradia
Allister McBride, Carl Zeiss SMT Ltd
Kevin Meade, Oxford Instruments NanoAnalysis
Drew Murray, Bruker Nano Surfaces Division
Del Redfern, Oxford Instruments
Patrick Shone, Olympus
Paul Southey, Carl Zeiss Ltd
Paul Spellward, Gatan
Amy Stobart, JEOL UK Ltd
Nic Vincent, Olympus
Sue Wilson, Leica
Mike Wombwell Quorum Technologies Ltd