Sponsored Content: Discover the New Hitachi SU9600 (T)SEM at IMC21

Booth 149

At Hitachi we want to help you explore the latest techniques in microscopy. That's why we're bringing the SU9600 (T)SEM to IMC21, where you can see for yourself what this groundbreaking instrument can do.

The new-concept SU9600 is a modular platform for advanced nanomaterials analysis. Bridging the gap between SEM and TEM, the SU9600 provides unique capabilities by combining SEM, 4D-STEM, EELS and nano-EDS together in one high-stability instrument. You can perform routine STEM analysis quicker than ever before, or undertake novel low-voltage multi-modal material investigations. All this is available alongside the capabilities of the world’s highest resolution SEM, allowing you to combine true surface information and transmitted-electron information for better nanoscale understanding.

Don't just take our word for it. Our lunchtime workshop programme is driven by our expert user community, with contributions from:

• Professor Quentin Ramasse (SuperSTEM, UK) on multi modal low-kV STEM
• Professor Arthur Blackburn (University of Victoria) on Ptychography from 20 kV - 300 kV
• Professor Frances Ross (MIT) on UHV in-situ TEM

Also on show at Booth 149: The HT7800 II TEM, TM4000PlusIII tabletop SEM, and IM5000 broad ion beam milling system. And the SU3900SE is available to see at the Bruker booth 125. Finally, while the HF5000 in-situ optimised TEM and NX5000 focused ion beam system won't be present at IMC21 this year, we will have experts on hand to answer any questions about these advanced instruments.

To learn more about Hitachi’s other activities at IMC21, or to organise a demo or discussion, click here.