The Journal of Microscopy is pleased to announce a new special issue dedicated 40 years of Atomic Force Microscopy
Guest Editors:
Kristina Rusimova, University of Bath, UK
Oleg Kolosov, Lancaster University, UK
Jamie K. Hobbs, University of Sheffield, UK
It has been forty years since Binnig, Quate and Gerber published their seminal paper “Atomic force microscope”, introducing the concept of Angstrom level resolution imaging, of insulators, in air, to the world. Since then, the AFM has become a mainstay of materials and life science research. The underlying concept has led to a proliferation of different modes that allow everything from inter and intra molecular forces to electrical properties to be measured, modified and controlled at the nanoscale.
With this special issue we aim to look forward to how the technique will grow over the next forty years, where new capabilities are emerging and where future challenges lie.
Deadline for submissions: 30 June 2026
Papers should be submitted through Research Exchange platform. Please choose the paper type 'Original Article', ‘Rapid Publication’ or ‘Methods and Procotols’ and choose “40 years of Atomic Force Microscopy” as the special issue.
For more information read our guidelines for authors.
If you have any questions, please contact Editorial Office Manager Jill Hobbs.