In-person (Loughborough University) & Online
The UK FIB&Prep User Group aims to provide an open platform for users of FIB (Focused Ion Beam) techniques and EM (Electron Microscope) specimen preparation equipment to share knowledge and explore best practices. Participants can exchange both theoretical and experimental insights, receive tips on preparing challenging specimens, and explore 2D and 3D analysis of complex data sets. It also offers an opportunity to learn about the latest instrumentation developments while connecting with both new and familiar colleagues.
Since its inception in 2013, its annual meeting has grown in stature, attracting a large number of participants. In response to attendee feedback, this year’s event will include hands-on training sessions focused on FIB applications such as Cross-sectioning, TEM sample prep and 3D EDS/EBSD. The workshop will be held hybrid (in person at Loughborough University and online).
With the rapid progression of FIB systems and sample preparation technologies, as well as their growing availability worldwide, we expect that expert-led presentations on the latest technological developments and their broad applications will offer valuable new insights.
RMS Ion Beam Microscopy FIG
Prof Beverley Inkson, Leeds University
Dr Carla Perezmartines, University College London
Dr Gareth Hughs, University of Oxford
Dr Geoff West, University of Warwick
Prof Ian MacLaren, University of Glasgow
Dr Katie Moore, University of Manchester
Dr Tomas Martin, University of Bristol
Dr. Richard Langford, University of Cambridge
Dr Stuart Robertson, Loughborough University
Prof Yu-Lung Chiu, University of Birmingham
Dr Xiangli Zhong, University of Manchester
Scientific Organiser
Dr Xiangli Zhong FRMS, MIMMM
Xiangli is a Senior Experimental Officer in the School of Materials, University of Manchester. Xiangli obtained her BEng in Metrology Instrumentation and MEng in Materials Science and Engineering. She has registered her PhD since 2006 in National University of Singapore. Xiangli has extensive experience and rich knowledge on electron microscopies, ion microscopies and sample preparation techniques. Her current research interest is on minimising focused ion beam (FIB) induced damages and FIB technical development on various types of materials.
Stuart Robertson
Dr. Stuart Robertson is a senior research fellow and manages the pFIB at Loughborough University, where he supports research and industry to characterise a range material systems including additively manufactured and sintered materials. His work has addressed challenges, in the application of Ion beam and electron microscopy. Following recent EPSRC funding for a new cathodoluminescence detector, his focus has shifted to characterising photovoltaic and semiconductor materials, including CdTe and SiC.
RMS Organisers
Nick Cameron
nick@rms.org.uk
+44 (0) 1865 254772
Contact Nick for exhibition and sponsorship event queries and RMS Corporate Membership.
