Wednesday 7 October
09:30 – 12:00
Morning Tutorial

Morning Tutorial

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12:00 – 13:00
Lunch

Break

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13:00 – 13:15
Introduction to LMCC and Using CL to Understand the Effects of Ion Damage (Stuart Robertson)

Afternoon Workshop

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13:15 – 13:30
Progress on the use of ionic liquid ion sources for nanomanufacturing (Carla Perez Martinez)

Afternoon Workshop

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13:30 – 13:40
Márton Iritz - Scimed : Artifact-Free TEM Sample Preparation: Perfecting FIB Lamellae with Technoorg Linda's GentleMill

Techno Bite

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13:40 – 13:50
Scott Doak - Thermo Fisher Scientific : Scios 3 DualBeam: New Capabilities for Sample Preparation and 3D Characterisation.

Techno Bite

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13:50 – 14:00
Joshua Lay - Gatan/EDAX : PIPS II - The ideal tool for clean up of TEM FIB Lamellae

Techno Bite

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14:00 – 14:15
Microstructural characterisation of battery materials ( Daniela Proprentner )

Afternoon Workshop

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14:15 – 14:45
Break

Break

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14:45 – 15:00
2D, 3D and in-situ EM analysis of ion beam sensitive materials (Xiangli Zhong)

Afternoon Workshop

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15:00 – 15:15
Advancing Correlative Ion Beam Microscopy: Inside Surrey's New Multimodal Ion Beam Imaging Facility (Catia Costa)

Afternoon Workshop

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15:15 – 15:25
Steve Murray - Hitachi High-Tech Europe

Techno Bite

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15:25 – 15:35
Martin Sláma - Tescan : The Best TEM Sample? Here's How to Be Sure

Techno Bite

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15:35 – 15:50
Focused Ion Beam Nano Lab: Device Fabrication to Characterisation in One Instrument (Bruce Jun-Yu Ou -Online)

Afternoon Workshop

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15:50 – 16:05
OpenSRIM (Gerhard Hobler - Online)

Afternoon Workshop

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16:05 – 16:35
Optional LMCC Tour

Afternoon Workshop

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