The Quantitative Analysis of Grain Size Course taking place on the Wednesday 12 October is now full. Due to demand, the RMS are repeating the course on Thursday 13 October. All registrations will now be for the course taking place on Thursday 13 October 2016.

The RMS and Struers are holding a one day joint course to promote the correct methods for the determination of Grain Size in engineering materials such as steel, aluminium, and ceramics.

This course is aimed at materials scientists who are regularly measuring grain size either for process quality control or those researching the grain size development of metals and ceramics.

Proposed Sessions

The aim of this course is to guide engineers on to how to use the correct method to determine grain size and properly interpret the results. This course will give you the understanding and confidence to make the correct decision on grain size, taking into consideration limitations and methods involved. 

The day will be split into 5 sessions: 

Session 1 will consider the sectioning of materials and surface preparation. Why Grain Size determination is important in materials. Standards and their application to specific materials. Importance of correct metallurgical sample preparation, etching techniques for a range of materials.

Session 2 is a practical session and will allow hands-on measurement of example microstructures using a range of techniques including the statistical analysis of data gained. Methods will include measurement by hand using linear intercept, planametric, ASTM Standards and comparison methods.

Session 3 will consider automated measurements including the analysis of more complex microstructures and how they relate to manual methods. Digital image analysis, single phase, multiphase and magnification effects.

Session 4 will look at the optical microscopy requirements. Namely correct Koehler setup, mounting the sample, inverted compared to upright microscope, connecting cameras, c-mounts and magnification.

Session 5 is a practical session allowing participants to see a range of samples with the opportunity to measure their own samples with guidance from tutors.

A number of materials samples and optical microscopes will also be available. Optical techniques used will include brightfield, darkfield, DIC and polarised light microscopy.

Speakers

Scientific Organiser: 

• 

  Mr Steve Metcalfe

  Microscopy 101 Ltd
  Steve has worked with optical microscopes for the past 30 years. His background in engineering, logical approach to problem solving and inquisitive nature make him an ideal partner for your microscopy questions.
  After a government (MoD) apprenticeship during which he qualified as an electronics engineer, Steve started ‘Sight Systems’, an imaging company providing innovative solutions for microscopy. Subsequently Steve was appointed as European Product Manager for Microscopy and Imaging products within Buehler, a materials sample preparation company.
  Recently Steve has specialised in materials microscopy within Carl Zeiss UK as manager of the Materials Microscopy Division. He has built up a wealth of knowledge about applications and optical techniques both in industry and academia.
  He now works for himself within a new company Microscopy101 Ltd.

Invited Speakers:

• 

  Mark Deven

  Struers Ltd

• 

  James Silvester

  Struers Ltd

• 

  Dr Paul Sheppard

  Microscopy101

• 

  Mr Eric Bennett

  National Physical Laboratory
  Eric is a Senior Research Scientist at the National Physical Laboratory which he joined in 1981. Throughout his career he has acquired skills in metallographic preparation, optical microscopy, scanning electron microscopy and image analysis of a wide range of materials. He is currently the facility leader of the microstructural characterisation facility in the Advanced Engineered Materials team at NPL. The facility is ISO 17025 UKAS accredited for “Measurement of Microstructural Features” for which Eric is the technical expert. He is also a member of BSI and sits on ISO/TC119/SC4 Sintered metal components and ISO/TC/172 Optics and Photonics. Additional, he is the Quality and Safety representative for the team.