Aberration-corrected Analytical Electron Microscopy *** NEW ***
Rik Brydson
ISBN: 978-0-470-51851-9 / Hardcover (296 pages)
September 2011
£39.95
ORDER ONLINE NOW
This new title in the RMS - Wiley Series is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration.
The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
View Table of Contents --- Read Chapter 1 (General Introduction to TEM)
Principles and Practice of Variable Pressure / Environmental Scanning Electron Microscopy
(VP-ESEM)
Debbie Stokes, RMS Honorary Secretary Science (Physical)
ISBN: 978-0-470-06540-2 / Hardcover (240 pages)
£39.95
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Offers a simple starting point to VP-ESEM, especially for new users, technicians & students.
~ Contains clear, concise explanations
~ Principles & applications outlined are generic and applicable to all types of VP-ESEM
~ Enables the reader to turn principles into practice
View Table of Contents --- Read Chapter 1
Interested in writing?
If you are interested in writing a book on microscopy or imaging as part of the new Handbook Series, please contact the Society to request a Proposal Form.
HANDBOOK SERIES
The RMS Handbook Series was designed to provide brief and authoritative introductions to all aspects of microscopy and many of the previously published titles are still available to order from the RMS.
View the full list of available titles with purchase information.
