Correlative Microscopy of a 2D Graphene Flake via Scanning Probe Microscopy (infocus #81 March 2026)

Atomic force microscopy (AFM) is a powerful technique often used to study surfaces at the nanoscale, helping researchers to better understand the structure and properties of materials.

DOI: 10.22443/rms.inf.1.307

This project focused on harnessing the adaptability of the simple AFM to perform correlative microscopy on a sample of graphene, allowing the properties of the heavily researched material to be presented through visual images.

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