infocus #44 December 2016 Microwave Imaging at the Nanoscale

This article examines a novel high frequency electrical characterisation microscope.

DOI: 10.22443/rms.inf.1.145

This high frequency microscope is for the nano-scale imaging of semiconductor devices, advanced materials and biological samples.

The scanning microwave microscopes (SMM) can extract quantitative material properties at GHz frequencies with nanometre accuracy.

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Author

Ferry Kienberger

SMM Group Leader, Keysight Labs Austria

Ferry Kienberger is the SMM group leader at Keysight Labs Linz. He obtained the PhD in 2002 in Technical Physics at JKU Linz with subsequent Postdoctoral stays in Bioinformatics and Biophysics at University of Salzburg and Linz. In 2007 he joined the central cooperate research lab of Agilent Technologies. The work included research in nano-biotechnology and measurement electronics including high frequency microwave applications. After the split of Agilent Technologies in 2014 he is member of the central research lab of Keysight Technologies and head of the Keysight research lab in Linz. Keysight is a leading test and measurement company headquartered in Santa Rosa, California, with 10.000+ employees.

Email:: [email protected]