Wednesday 27 October
14:00 – 14:20 BST
Large area pFIB cross sections in half the time with gas assisted milling

Invited Speaker

14:20 – 14:40 BST
Helios 5 Laser PFIB-- extending nanometer characterization to millimeter scale

Invited Speaker

14:40 – 15:00 BST
Introduction to the fs-laser PFIB

Invited Speaker

15:00 – 15:20 BST
Advanced TEM Lamella Preparation in FIB-SEM by Taking Advantage of Innovative Lift-out Methods

Invited Speaker

15:20 – 15:40 BST
Using FIB and nanoindentation for micromechanical testing of coatings

Invited Speaker

15:40 – 15:50 BST
Coffee Break

Coffee Break

15:50 – 16:10 BST
Getting the best out from FIB: ion beam damages and optimization methods

Invited Speaker

16:10 – 16:30 BST
Broad ion beam milling for energy materials

Invited Speaker

16:30 – 16:50 BST
Advances in FIB Lift Out Methods and Accessories

Invited Speaker

16:50 – 17:10 BST
Material Sputtering with a Multi Ion Species Plasma FIB

Invited Speaker

17:10 – 17:15 BST
Meeting Close

Meeting End