Wednesday 27 October
14:00 – 14:20
Large area pFIB cross sections in half the time with gas assisted milling

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14:20 – 14:40
Helios 5 Laser PFIB-- extending nanometer characterization to millimeter scale

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14:40 – 15:00
Introduction to the fs-laser PFIB

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15:00 – 15:20
Advanced TEM Lamella Preparation in FIB-SEM by Taking Advantage of Innovative Lift-out Methods

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15:20 – 15:40
Using FIB and nanoindentation for micromechanical testing of coatings

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15:40 – 15:50
Coffee Break

Coffee Break

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15:50 – 16:10
Getting the best out from FIB: ion beam damages and optimization methods

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16:10 – 16:30
Broad ion beam milling for energy materials

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16:30 – 16:50
Advances in FIB Lift Out Methods and Accessories

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16:50 – 17:10
Material Sputtering with a Multi Ion Species Plasma FIB

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17:10 – 17:15
Meeting Close

Meeting End

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