The EM-UKI community meetings are an open forum for discussion of the latest developments and challenges in the field, suitable for both academic and commercial microscopists. The meeting will include techno bites, talks, and discussions, and also hosts the annual RMS EM lecture.
This year's programme will include the following sessions:
- RMS EM Lecture
- Updates from the EM Community
- Funding
- Careers & Outreach
- Interactive Methodology
This will be an in-person event.
Committee Chairs & 2027 Hosts:
Rik Brydson
Rik holds a chair in the Institute for Materials Research (IMR) in the School of Process Environmental and Materials Engineering at the University of Leeds. He heads the NanoCharacterisation group based around the Leeds Electron Microscopy and Spectroscopy (LEMAS) centre which is shared between Materials and Earth Sciences and also acts as an EPSRC facility for external UK researchers. He has a general research interest in high spatial resolution chemical analysis in nanostructured materials, and has a current research h index of 32 with over 25 years research experience in nanomaterials characterisation. He has managed extensive national and international collaborations including being current consortium leader for the UK National Facility for Aberration corrected Electron Microscopy, SuperSTEM at Daresbury.
Rik is also on the Management Board of the European Microscopy Society. He has written an RMS Handbook on Electron Energy Loss Spectroscopy (Bios /Taylor and Francis 2001), has co-written a book on “Nanoscale Science and Technology" (Wiley 2005), edited a recent RMS book on Analytical Aberration-corrected Transmission Electron Microscopy with Wiley and has contributed a number of other chapters in specialist books on electron microscopy by other professional bodies covering Physics, Chemistry and Engineering. In recent years his research interests have focused on applying high spatial resolution characterisation methods (particularly TEM and EELS) to the nanochemical analysis of softer, more radiation sensitive materials.
RMS Contacts:
