Wednesday 2 November
13:00 – 13:30
Use of modern FIB methodologies for applications in Atom Probe Tomography
13:30 – 13:50
Pioneering the use of micropillar compression for the study of the interfacial properties of coatings
14:05 – 14:25
New possibilities using Cryo-FIB-SEM
14:25 – 14:40
Cryo EXLO for Cryo FIB/TEM Specimen Preparation
14:40 – 14:55
Direct measurement of TEM lamella thickness in FIB-SEM
15:15 – 15:35
A method for visualizing Li distribution in lithium-ion batteries by Plasma FIB-SEM, EDS, and SIMS
15:35 – 15:55
FIB-SEM based ToF-SIMS in planetary science
15:55 – 16:10
Using Femtosecond Laser Ablation as a Prep Tool for FIB-SEM Workflows
16:10 – 16:25
Is Large Area TKD Really Possible?
