Microscopy of Semi-Conducting Materials 2027

Anders Gustafsson

SUSTEch Shenzhen and Uni Lund

Anders Gustafsson is currently a professor at the Institute of Nanostructures and Application and College of semiconductors at the Southern University of Science and Technology (SUSTech) in Shenzhen, and a guest professor at NanoLund and Solid State Physics at Lund University, Lund, Sweden. He got his PhD from Lund University in 1991 and has mainly worked in Lund, apart from spending two years at École Polytechnique Fédérale de Lausanne, Switzerland. As of 2025 he is a full-time professor at SUSTech. During his research career, he has been working with optical, structural and electrical properties of various semiconductor materials and structures, mainly using cathodoluminescence.

Rachel Oliver

University of Cambridge, UK

Professor Rachel Oliver is Director of the Cambridge Centre for Gallium Nitride.  The focus of her research is understanding how the small scale structure of nitride materials effects the performance and properties of devices. She uses expertise in microscopy and materials growth to develop new nanoscale nitride structures which will provide new functionality to the devices of the future.  She is also passionate about communicating science to the general public and hence widening participation in science by under-represented groups, particularly women.

Tomas Aidukas

PSI Villigen

Tomas Aidukas earned his PhD from the University of Glasgow in 2021, where he pioneered innovative computational microscopes, leveraging techniques like ptychography for low-cost and high-speed optical imaging. Transitioning these skills to the Paul Scherrer Institute as a Postdoctoral Researcher, he advanced the frontiers of 3D X-ray microscopy, notably achieving a world-record 4 nm resolution via ptychographic tomography. In June 2026, Tomas joined EPFL to lead the newly formed Laboratory for Nanoscale X-ray Metrology, backed by a highly competitive SNSF Starting Grant. The group will work on the NEXUS-3D project, dedicated to developing advanced X-ray microscopy methods for semiconductor metrology.