Expertise
Imaging Platform
keywords - light microscopy: atomic force microscopy
• Bruker/JPK Nanowizard V: Available for topographic characterization in contact, dynamic and force-spectroscopy-based modes in air and liquid. It also allows nanomechanical characterization of surfaces and fast-scan measurements up to 400 lines/s in 2x2 um2 areas. Due to its scanning by probe configuration, it can be attached to an inverted Nikon optical microscope allowing correlative optical measurements (including fluorescence) on transparent samples.
• JPK Nanowizard II: Available for topographic characterization in contact and dynamic in air and liquid enviroments.
• NT-MDT Ntegra Prima: Available for typical topographic characterization, electrical and magnetic characterization.
• Nanotec Cervantes: Available for topographic measurements in contact, dynamic and jumping modes. It also includes magnetic and electrical modes (EFM, KPM, CAFM).
Applications
Keywords - biological: cell biology | microbiology | bio-materials
keywords - physical sciences: Bioengineering & Biomaterials | Geology/Mineralogy | Nanomaterials | Magnetics, magnetic materials & spintronics | Polymers & organic electronics
Data Analysis
We can support and assist users in the analysis of their data and ensure their requirements are met.