Expertise
Imaging Platforms
Keywords - Electron Microscopy: Transmission EM | Scanning Transmission EM | Scanning EM (Tungsten) | Scanning EM (FEG) | Focused Ion Beam SEM
Transmission: JEOL ARM-200F STEM, JEOL JEM-3000F FEGTEM, JEOL JEM-2100,
Scanning: Zeiss Merlin, Zeiss EVO, Tescan Mira
Focussed Ion Beam: Zeiss NVision 40 FIB-SEM, Zeiss Auriga FIB-SEM, Zeiss Crossbeam 540 FIB-SEM, Thermo-Fisher Helios CXe PFIB
Applications
Keywords - Physical Sciences: Bioengineering and biomaterials | Electron Optics | Metallurgy / alloy development | Corrosion / oxidation | Functional oxides | Semiconductors and optoelectronics | Nanomaterials (nanoparticles, 2D nanomaterials, nanowires and nanotubes) | Composites | Optical and photonic materials and devices | Magnetics, magnetic materials and spintronics | Catalysts | Polymers and organic electronics | Ionic conductors, fuel cells and batteries
Sample Preparation
Keywords - Materials: Argon ion thinning | Focussed ion beam (Gallium) | FOCUSSED ION BEAM (XENON) | Electropolishing | Tripod polishing
Data Analysis
Keywords - Software: ImageJ | Amira | Matlab | Digital Micrograph / GMS | HR-STEM simulation packages (various) | HRTEM simulation packages (various) | Other Image simulation for crystals | Hyperspy
