
Expertise
Imaging Platforms
Keywords - Electron Microscopy: Transmission EM, Focused Ion Beam SEM, Scanning Transmission EM
Keywords - Physical Sciences: Plasmonics, Corrosion/Oxidation, Geology/Mineralogy, Catalysts, Metallurgy/Alloy development, Electron optics, Functional oxides, Nanomaterials, Composites, Planetary sciences
At ePSIC we have two primary instruments: E01: a JEOL ARM200CF optimised for atomic resolution spectroscopy and E02: a JEOL ARM300CF optimised for high resolution imaging. We also offer access to a JEOL 4700 dual beam FIB and JEOL low energy argon ion miller.
Applications
Keywords - Materials: Argon ion thinning, Focused ion beam (Gallium)
Data Analysis
Keywords - Software: HR-STEM simulation packages (various), Digital Micrograph/GMS, HRTEM simulation packages (various), Hyperspy
Access to Diamond compute cluster. Access to Diamond JupyterHub resource.