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Kelvin Nanocharacterisation Centre

Imaging and analysis of materials at lengths from the sub-millimetre to the atomic scale. Our expertise is focused around the application of electron and ion microscopes. Our research has advanced the understanding of structure-property relationships in important technological materials including nanomagnetic structures, semiconductor devices, thin film optical coatings, oxide materials, including ferroelectrics, advanced metal alloys and polymer films & devices.



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Expertise

Imaging Platforms

Keywords - Electron Microscopy: Transmission EM | Scanning Transmission EM | Electron tomography | Scanning EM (FEG) | Focused Ion Beam SEM | Cryo-TEM

Applications

Keywords - Physical Sciences: Bioengineering and biomaterials | Metallurgy / alloy development | Corrosion / oxidation | Functional oxides | Semiconductors and optoelectronics | Nanomaterials (nanoparticles, 2D nanomaterials, nanowires and nanotubes) | Geology / mineralogy | Planetary sciences | Magnetics, magnetic materials and spintronics | Polymers and organic electronics | Ionic conductors, fuel cells and batteries

Sample Preparation

Keywords - Materials: Argon ion thinning | Focussed ion beam (Gallium)

Data Analysis

Keywords - Software: Amira | Matlab | Digital Micrograph / GMS | HR-STEM simulation packages (various)


Point of Contact

Kelvin Nanocharacterisation Centre
Kelvin Nanocharacterisation Centre
Kelvin Way
School of Physics and Astronomy, University of Glasgow
Glasgow, G12 8QQ, United Kingdom


Dr Ian MacLaren, +44 (0)141 330 4707