International Microscopy Focus Lecture Series - Professor Sir Peter Hirsch
Tuesday 26 October 2021
This initiative is a collaborative undertaking by three international Microscopy Societies (the Microscopical Society of Canada, the Israel Society for Microscopy and the Royal Microscopical Society, UK).
We are pleased to announce that our first guest is Professor Sir Peter Hirsch, and that lecture series begins with a recorded conversation between Professor Sir Peter Hirsch and Professor Pete Nellist entitled "A historical account of the impact of TEM in Materials Science ".
Registration to this lecture is free.