Richard  Beanland

Richard Beanland

University of Warwick; Coventry, UK; Optimising material quality in group III-antimonides on silicon; developing UltraRAM devices for low-energy data storage

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Nikolay  Cherkashin

Nikolay Cherkashin

CEMES; Toulouse, France; Novel approach for displacement and strain mapping from HR-(S)TEM images of crystalline materials

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Maria    de la Mata

Maria de la Mata

Universidad de Cadiz, Spain; Electron microscopy of radiation sensitive semiconductor composites

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Sarah Haigh

Sarah Haigh

University of Manchester, UK

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Axel  Persson

Axel Persson

Linköping University, Sweden; Mg doping of GaN by hot-wall metal-organic chemical vapour deposition.

Frances M  Ross

Frances M Ross

Massachusetts Institute of Technology, USA

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Jean-Luc  Rouviere

Jean-Luc Rouviere

CEA Grenoble, France; Electron diffraction for atomic position, strain, electric and magnetic potential measurements

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David  S. Ginger

David S. Ginger

University of Washington, Seattle, USA; Multimodal Microscopy on Emerging Semiconductors for Photovoltaics and Neuromorphic Computing

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Julita  Smalc-Koziorowska

Julita Smalc-Koziorowska

Institute of High Pressure Physics 'Unipress'; Warsaw, Poland; Peculiarities of the strain relaxation in InGaN epilayers

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Michael Stöger-Pollach

Michael Stöger-Pollach

Investigations of Optical Excitations in Semiconductors using Scanning Transmission

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